July 2002

FormFactor First to Introduce Six-Touchdown Probe Card to Test 300mm DRAM Wafers

New PH150 probe card reduces cost of test and capital equipment outlay while increasing test capacity for 300mm wafer fabrication facilities

SEMICON West, San Jose, Calif. – July 17, 2002 – FormFactor, the world’s leading provider of advanced wafer probe cards, today introduced the PH150TM probe ...

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