August 2003

FormFactor Sets New Benchmark in 300 mm DRAM Wafer Test Efficiency

Wafer probe card tests 253 DRAM die in a single touchdown

LIVERMORE, CA – Aug. 4, 2003 – FormFactor, Inc. (Nasdaq: FORM), a leading provider of advanced wafer probe cards, today announced the volume production release of its large-area array probe card that tests an industry ...

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