August 2009

FormFactor Reaches Reliability Milestone with TakumiTM Parametric Probe Card

Parametric test technology still in service after more than 15M contact cycles

LIVERMORE, Calif. – August 11, 2009 – FormFactor, Inc. (Nasdaq: FORM) today announced it has reached a new reliability milestone for its TakumiTM wafer probe card—an advanced probing solution used by IC manufacturers for ...

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