November 2009

ITC Issues Final Determination in FormFactor’s Wafer Probe Card ITC Action

LIVERMORE, Calif. – November 13, 2009 – FormFactor, Inc. (Nasdaq: FORM) announced today The International Trade Commission (ITC) issued a final determination in the investigation of probe card manufacturers Phicom Corporation and Micronics Japan Company, Ltd., Investigation No. 337-TA-621. In the Final Determination, certain of ...

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November 2009

FormFactor Qualifies Industry’s First One-Touchdown 300-mm Wafer Probe Solution for DRAM Sort Test

Probe card employs FormFactor’s advanced TRETM technology to extend available test capacity 

LIVERMORE, Calif. – November 10, 2009 – FormFactor, Inc. (Nasdaq: FORM) today announced a major milestone for the semiconductor test industry — production qualification of the industry’s first one-touchdown probe card for 300-mm DRAM ...

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