December 2009

FormFactor Ships 125th DRAM Wafer Probe Card with Advanced TRETM Technology

Advanced TRE extends the life of existing testers and reduces additional capital expenditures

LIVERMORE, Calif. – December 29, 2009 – FormFactor, Inc. (Nasdaq: FORM) today announced that it has reached a milestone with the shipment of the 125th wafer probe card incorporating the company’s proprietary advanced ...

Read More

December 2009

FormFactor Expands MEMS Wafer Probe Capabilities in Leading-Edge Wire Bond Logic Applications with New Wafer Probe Contact Technology

FormFactor Expands MEMS Wafer Probe Capabilities in Leading-Edge Wire Bond Logic Applications with New Wafer Probe Contact Technology

LIVERMORE, Calif. – December 1, 2009 – FormFactor, Inc. (Nasdaq: FORM) today introduced a new MEMS probing contact technology for its advanced probe cards for wire bond logic ...

Read More

December 2009

FormFactor Introduces Next-Generation 300-mm Full-wafer Test Solution for DRAM

SmartMatrixTM100 probe solution lowers test cost per die for leading-edge mobile and commodity DRAM test applications and extends the life of the tester cell

LIVERMORE, Calif. – December 1, 2009 – FormFactor, Inc. (Nasdaq: FORM) today introduced its next generation 300-mm full-wafer-contact probe card for DRAM ...

Read More

December 2009

FormFactor to Present at the Barclays Capital Global Technology Conference

LIVERMORE, Calif. — Dec. 1, 2009 —- FormFactor, Inc. (Nasdaq:FORM) is pleased to announce its participation in the Barclays Capital Global Technology Conference in San Francisco, CA, on December 8, 2009, at 11:00 AM Pacific Standard Time.

The company’s chief executive officer, Mario Ruscev, and chief ...

Read More