March 2014

FormFactor Enables 2.4Gb/s At-Speed Test Breakthrough for Mobile DRAM Testing

Multiple DRAM Suppliers Take Delivery of Advanced High-Frequency Probe Cards for Known Good Die Testing

LIVERMORE, Calif. — March 17, 2014 — FormFactor, Inc. (Nasdaq: FORM) today announced the release of its latest High Frequency Test-at-Probe (HFTAP) probe-card technology, which enables mobile DRAM wafer test speeds ...

Read More