The FormFactor TouchMatrix™ wafer probe solution is designed specifically to deliver the lowest overall test cost per die for 200mm and 300mm NAND and NOR Flash wafer testing. It provides massive parallelism and adjusts to variations in manufacturers’ test equipment and product designs, to optimize probe planarity and speed set-up. Together, these features improve productivity and reduce the total cost of ownership.
TouchMatrix™ product capabilities include:
- One-touchdown probing
- Field-adjustable planarity
- Efficient, high-integrity electrical test