We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.
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We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.
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We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.
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FRT Metrology manufactures powerful surface metrology tools for production, development, and quality control. Based on the design and construction of these multi-sensor devices, FRT Metrology tools can be used for a wide range of wafer and non-wafer applications.
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FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.
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Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.
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FormFactor engineers recently had the thrill of designing and building two prototype HPD cryostats for the Submillimeter Array on Maunakea in Hawaii. The SMA is a collaborative project with the Smithsonian Astrophysical Observatory (SAO) and Academia Sinica Institute of Astronomy and Astrophysics.