4 Wafer-Level Test Solutions for IR Sensors
November 16, 2018
Wafer probe systems are able to provide the required environment for IR sensor testing prior to packaging. The needed adaptations for the target test temperature, the device stimulation, and measurement accuracy are implemented and established as field-proven solutions.
July 26, 2018
CM300xi – Enabling Automation While Compressing Cycle Times
We’ve integrated a number of our proprietary technologies to produce Contact Intelligence, which enable automation and compress cycle times to an ab...
December 7, 2017
Transforming 300 mm Probing with Contact Intelligence Technology
Our CM300xi probe system is the first probe system to deliver integrated Contact Intelligence technology. Contact Intelligence automation targets the...