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5G mmWave Enabling Higher Parallelism Wafer Test

5G has been pushing on wafer test of several years now and the test cell is evolving to more complex systems. Same as the change to multicellular life during the Phanerozoic Eon, we are seeing a concerted change to multi-DUT testing with 5G parts in order to improve the output from manufacturing wafer test. Now, 5G is in the middle of ramp, with more handsets being released with 5G FR2 chipsets being released. Current estimates put up to a 150.7% CAGR increase in the number of devices with 5G from now until 2024. This growth requires a subsequent increase in the wafer test capability in the manufacturing flow to provide Known Good Die (KGD) in a reasonable cost of test. There are multiple ways to increase the volume and minimize cost of test. Some of these include more test cells, but buying more testers is can become cost prohibitive. Another strategy is to provide more test parallelism with upgraded testers that have mW frequency capability with a low number of channels in the tester, but resources are extended by using switches and other types of channel count increase. Another method is to use wafer loopback test, but that reduces the test visibility due to the signals never getting back to the tester. All of these have advantages and drawbacks. We will discuss multiple ways to do this as well as discuss the Cost of Ownership Implications.

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5G mmWave Enabling Higher Parallelism Wafer Test_TestVision-21.pdfDownload