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Accelerated Solid State Qubit Pre-Screening

Until recently, quantum engineers operating devices at milli-Kelvin temperatures are faced with the difficulties and inconveniences of long development cycles The major bottlenecks include time-consuming wire bonding, expensive packaging processes prior to device cooldown, and long cooldown times for dilution refrigerators This workshop presents an integrated measurement solution for Pre-Screening qubit devices, allowing quantum engineers to eliminate wire-bonding and packaging from cryogenic test processes and to provide critical qubit performance parameters at 50 mK, thus streamlining device deployment, and reducing the time for development cycles

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