Evaluation of Advanced Probe Cards for Large-Array Fine-Pitch Micro-Bumps

Learn about testing the most challenging micro-bump probe targets such as HBM2 (large arrays of ~4,900 micro-bumps) and Wide I/O Mobile DRAM (40 µm pitch).

Created: December 8, 2017 | Updated: June 12, 2020 | Type: pdf | Size: 1.92 MB

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