SmartMatrix 1500XP Datasheet

SmartMatrix 1500XP provides 300 mm full-wafer contact testing on mobile and commodity DRAM, graphic memory (GDDR), high bandwidth memory (HBM), and emerging memory devices. Specifically developed to support fast design ramps and advanced product roadmaps, this platform extends the proven Matrix™ architecture to address increased probe card parallelism up to 1536 sites per wafer on a single touchdown.

Created: October 12, 2017 | Updated: October 12, 2017 | Type: pdf | Size: 1.17 MB

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