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  • T-Wave RF mmW Probe
  • T-Wave RF mmW Probe
  • Autonomous RF Measurement Assistant with T-Wave Probes and VDI Mini Frequency Extenders on 200 mm Probe Station SUMMIT200
  • mm-Wave Measurement Setup with T-Wave Probes, RF TopHat and VDI Mini Frequency Extenders on FormFactor\'s 200 mm Probe Station SUMMIT200
  • T-Wave Probes and VDI Mini Frequency Extenders on FormFactor\'s 200 mm Probe Station SUMMIT200
  • T-Wave Probes on FormFactor\'s 200 mm Probe Station SUMMIT200

T-Wave Probes set the industry performance standard for on-wafer measurements of millimeter and submillimeter wavelength devices. T-Wave Probes include both waveguide banded probes and broadband (dual band) probes.

T-Wave RF mmW Probe

T-Wave Waveguide Banded Probes

  • Low insertion loss
  • Low contact resistance
  • 140 GHz – 1.1 THz versions
  • Probe pitch as narrow as 25 μm
  • Lithographically-defined probe tip
  • Nickel contacts

T-Wave RF mmW Probe

T-Wave Broadband (Dual Band) Probes

  • kHz to 170 GHz and kHz to 220 GHz versions available  
  • Low insertion loss  
  • Low contact resistance  
  • On Probe Integrated diplexer for integrating the coax and Wave Guide bands 
  • Probe pitch as narrow as 50 μm  
  • Lithographically defined probe tip  
  • Nickel contacts  
  • Exclusively available for use with the following system setup:  
    • FormFactor Probe systems using RFA probe arms with 45° dual frequency extender mounts  
    • Keysight 5291A VNA with integral 220 GHz single sweep capability  
    • Plus the Keysight M4 heads pared with the VDI Mini extended range frequency extenders 

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170 GHz / 220 GHz Broadband Vector Network Analysis Solution

FormFactor, Keysight Technologies, DMPI, and Virginia Diodes, have joined forces to deliver a new 170 GHz / 220 GHz Broadband Vector Network Analysis (VNA) Solution that shortens design and verification cycles for 5G and emerging 6G applications.

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Autonomous RF Measurement Assistant

FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.

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Autonomous RF Calibration and Wafer Probing Over Temperature at High Frequency

Anthony Lord, Director of the RF Market Segment at FormFactor Inc., demonstrates autonomous calibration monitoring and re-calibration over multiple temperatures at frequencies up to 330GHz.

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1.1 THz Calibration on an EPS200MMW Manual Wafer Probe Station

This video gives an overview of a typical calibration run at 1.1 THz on a Cascade EPS200MMW manual probe station with THz SIGMA Kit. WinCal XE calibration software runs directly on a 67GHz PNA from Keysight Technologies. The frequency extenders are 1.1 THz models from Virginia Diodes and probes are Cascade T-Wave Probes.