• A Mobile-driven World

    Powered by Amazing Integrated Circuits
    Produced by leading Semiconductor Manufacturers
    Performance-tested by FormFactor Technologies

    Mobile Semiconductors

    When features and functions compete for power in a compact mobile device, only the most power-efficient ICs will do. That’s why low-power ICs in virtually every smart phone on the planet have been touched by FormFactor technologies.

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  • A Mobile-driven World

    Powered by Amazing Integrated Circuits
    Produced by leading Semiconductor Manufacturers
    Performance-tested by FormFactor Technologies

    Computing Semiconductors

    Thanks to powerful multi-core processors, the performance speeds and energy-efficiency in servers, PCs and handheld devices continue to soar. And the IC innovation trajectory is enabled by FormFactor’s wafer test probes.

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  • A Mobile-driven World

    Powered by Amazing Integrated Circuits
    Produced by leading Semiconductor Manufacturers
    Performance-tested by FormFactor Technologies

    Consumer Semiconductors

    Running multi-media applications in multi-tasking environments is a heavy lift – even for the most powerful ICs.  FormFactor probes are enabling the ICs that fuel gaming consoles, cameras and other cool consumer products.

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  • A Mobile-driven World

    Powered by Amazing Integrated Circuits
    Produced by leading Semiconductor Manufacturers
    Performance-tested by FormFactor Technologies

    Automotive Semiconductors

    Today’s Connected Car contains 100s of ICs – created with technologies like flip-chip and Cu pillars. FormFactor probe card innovations enable the new applications by increasing throughput, and ensuring device quality and reliability.

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The FormFactor Approach to

Customer Collaboration

Every probe card project is unique to an individual IC design. So it’s critical that all aspects of the design and build are closely and collaboratively managed. That’s why our partnership with customers begins at the earliest design phase, when we collectively evaluate advanced packaging and wafer test feasibility for new IC designs.

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Latest FormFactor News

09.15.14
FormFactor, Inc. Files Universal Shelf Registration on Form S-3
09.11.14
FormFactor Introduces Advanced MEMS-based Probe Card for NAND Flash Device Testing
08.25.14
FormFactor to Present at the Citi 2014 Global Technology Conference

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