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  • High Voltage Probe

  • Coaxial and triaxial measurements up to 10,000 V
  • High-quality construction with low-noise electrical performance
  • Replaceable probe tips in a variety of tip sizes
  • Temperature range of of -60°C to 300°C
  • Triaxial measurement ensures a much better understanding of device leakage in the off state
  • Highly reliable, stable and repeatable measurements
  • Integrally designed as part of a complete measurement solution


TESLA200 - 200mm High Power Probe System

The TESLA200 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables collection of accurate high voltage and high current measurement data, with complete operator safety.