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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                • Products
                  • Probe Systems
                    • (Modular Systems)
                    • 150 MM Probe Systems
                      • MPS150
                      • Genius Education Kits
                    • 200 MM Probe Systems
                      • Summit
                      • BlueRay
                      • PM8/EPS200
                      • See All…
                    • 300 MM Probe Systems
                      • CM300
                      • PM300
                      • See All…
                    • (Dedicated Systems)
                    • Autonomous Assistants
                      • Autonomous DC
                      • Autonomous RF
                      • Autonomous SiPh
                    • Power Systems
                      • Tesla
                    • Board Level Systems
                      • Board Test Systems
                    • Cryogenic Systems
                      • Wafer/Multi-chip Probe Systems
                      • Chip-scale Probe Systems
                      • Cryostats
                      • Vacuum/Pressure Systems
                    • (Integrated Systems)
                    • With KeySight
                      • IMS-K-mmW/THz
                      • IMS-K-SiPh
                      • IMS-K-Power
                      • IMS-K-DC
                      • IMS-K-LFN
                    • Software
                      • Velox
                      • WinCal XE
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                        •  
                          •  
                      •  
                        •  
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                    •  
                    •  
                    •  
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • InfinityXT™ Probe – Coaxial
                      • Infinity Waveguide Probe
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                    • T-WAVE
                      • T-Wave Probe
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Optical Probes
                      • Cryogenic Probes
                    • SIGNAL INTEGRITY
                      • FPC Probe
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                    • Product Support
                      • Probe Support
                      • Probe Repair
                      • WinCal Support
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                    • FLASH
                      • TouchMatrix
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                    • [ RF Probing ]
                    • Type/Application
                      • RF-Front End
                      • 5G mmWave
                      • RF Transceivers
                      • Auto-Radar
                      • High Speed Digital
                    • Platforms
                      • Pyramid RF
                      • Pyrana RF
                  • Metrology
                    • Metrology Systems
                      • MicroProf® AP
                      • MicroProf® FS
                      • MicroProf® FE
                      • MicroProf® MHU
                      • MicroProf® TL
                      • MicroProf® 300
                      • MicroProf® 200
                      • MicroProf® 100
                • Test Expertise
                  • Customer Collaboration
                    • Sharing Expertise
                    • Lab to Fab
                  • Applications
                    • 5G Devices
                    • Advanced Packaging
                    • Cryogenic Devices
                    • DC Parametric Test
                    • Low Frequency Noise
                    • mm-Wave Load-Pull
                    • Power Semiconductors
                    • Silicon Photonics
                    • VCSEL and MicroLED
                  • Technologies
                    • Contact Intelligence
                    • MEMS
                  • Publications
                    • Technical Papers
                    • Case Studies
                    • Test Insights Presentations
                  • MEASUREONE LEADERSHIP ALLIANCES
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • Power Semiconductor Probing
                    • RF Tuning & Load-Pull
                    • S-Parameter & DC Parametric
                    • Silicon Photonics Test
                    • Terahertz Probing
                • Company
                  • About Us
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                    • FRTmetrology.com
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                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
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                    • Logistics Service
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
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                    • Analytical Probe Support
                    • Analytical Probe Repair
                    • Pyramid Probe Card Support
                    • WinCal XE Support
                    • Documentation & Downloads
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                Asset 4
                  Company Board of Directors

                  Board of Directors

                  Thomas St. Dennis

                  Chairperson of the Board of Directors

                  Thomas St. Dennis has served as a director since September 2010. Mr. St. Dennis served as our Executive Chairperson of the Board of Directors from October 23, 2013 until February 2016, after which he has served as the Chairperson of the Board of Directors. Mr. St. Dennis served as our Chief Executive Officer from September 2010 through December 2014. Mr. St. Dennis previously held various positions at Applied Materials from 1992 to 1999 and again from 2005 to 2009. His most recent role at Applied was the Senior Vice President and General Manager of the Silicon Systems Group. He also worked at Novellus Systems as the Executive Vice President of Sales and Marketing from 2003 to 2005. From 1999 to 2003 Mr. St. Dennis was the President and CEO of Wind River Systems. Mr. St. Dennis holds a B.S. in Physics and a M.S in Physics, both from University of California, Los Angeles.

                  Michael Slessor

                  President & Chief Executive Officer

                  Mike Slessor has served as CEO since January, 2015 and as President since October, 2013. Prior to this, Mike served as the Sr. VP & General Manager, MicroProbe Product Group from October 2012 to October, 2013. Also, before joining FormFactor, Mike was the President and Chief Executive Officer of MicroProbe from July 2008 through the October 2012 closing of FormFactor’s acquisition of MicroProbe. Prior to joining MicroProbe, Mike held various management, product-marketing, and applications-engineering positions in the semiconductor industry, most notably with KLA-Tencor, where he led marketing and applications for the company’s fastest growing division.

                  Dr. Slessor received his Ph.D. in Aeronautics and Physics from Caltech and his B.A.Sc. in Engineering Physics (First Class Honors) from the University of British Columbia.

                  Raymond A. Link

                  Raymond Link has served as a Director since June, 2016, following our acquisition of Cascade Microtech. Mr. Link was a Director of Cascade Microtech from February 2005 through June 2016. From July 2005 to April 2015, Mr. Link served as Executive Vice President and Chief Financial Officer of FEI Company, a leading supplier of scientific and analytical instruments for nanoscale imaging. Prior to this, Mr. Link was the Chief Financial Officer of TriQuint Semiconductor, Inc., a manufacturer of signal processing components for wireless communications. He is on the board of nLight Inc., a maker of high-power semiconductor lasers. Mr. Link received a B.S. degree from SUNY at Buffalo and an M.B.A. from the Wharton School and is a licensed Certified Public Accountant and a Fellow with the National Association of Corporate Directors.

                  Lothar Maier

                  Lothar Maier has served as a Director since November 2006. Mr. Maier served as the Chief Executive Officer and a member of the board of directors of Linear Technology Corporation, a supplier of high performance analog integrated circuits, from January 2005 to March 2017. Prior to that, Mr. Maier served as Linear Technology’s Chief Operating Officer from April 1999 to December 2004. Before joining Linear Technology, Mr. Maier held various management positions at Cypress Semiconductor Corporation, a provider of high-performance, mixed-signal, programmable solutions, from 1983 to 1999, most recently as Senior Vice President and Executive Vice President of Worldwide Operations. Mr. Maier holds a B.S. in chemical engineering from the University of California at Berkeley.

                  Rebeca Obregon-Jimenez

                  Rebeca Obregon-Jimenez has served as a Director since September 2019. Ms. Obregon-Jimenez currently serves as Corporate Vice President of the Advanced System in Package Business Unit for Amkor Technology, Inc., one of the world’s largest providers of outsourced semiconductor packaging and test services. From 2014 to 2019, Ms. Obregon-Jimenez served at Amkor as a Corporate Vice President of Sales, and as a Senior Vice President in sales, strategic program management, and in operations finance. From 1999 to 2014, Ms. Obregon-Jimenez held executive and senior management positions at Integrated Device Technology, Inc., and Integrated Circuit Systems, Inc., in test operations, test engineering and product engineering. From 1990 to 1999, she served in the Semiconductor Products Sector of Motorola, where she held roles of increasing responsibility in a variety of engineering positions. Ms. Obregon-Jimenez earned her B.S. in electrical engineering from Arizona State University and her M.S. in electrical engineering from the National Technological University.

                  Sheri Rhodes

                  Sheri Rhodes has served as a Director since December 2019. Ms. Rhodes is currently the Chief Information Officer at Workday, Inc., overseeing the company’s global information technology organization. Prior to joining Workday, Ms. Rhodes served as Chief Technology Officer at Western Union from 2017 to 2019. Ms. Rhodes served as the Chief Information Officer at Electronics for Imaging from 2015 to 2017. Ms. Rhodes also held roles of increasing responsibility at Symantec from 2009 to 2015, including as Vice President of Global Applications from 2012 to 2015. Ms. Rhodes held management positions at Providian Financial Corporation and its successor Washington Mutual from 1999 to 2008, including as a First Vice President from 2005 to 2008.  From 1990 to 1999, Ms. Rhodes held management positions at KMPG and Wells Fargo. Ms. Rhodes earned a B.S. in Business Administration and an M.B.A. from San Diego State University.

                  Edward Rogas, Jr.

                  Edward Rogas, Jr. has served as a Director since October 2010. Mr. Rogas currently serves as a Director on the board of Vitesse Semiconductor Corporation. Mr. Rogas served as a Director of Vignani Technologies Pvt Ltd until February 2014 and Photon Dynamics, Inc., from May 2006 to October 2008. Mr. Rogas held management positions at Teradyne, Inc. for over 30 years, including serving as Senior Vice President from 2000 through 2005. Mr. Rogas holds an M.B.A. degree from Harvard Business School and a B.S. from the United States Naval Academy.

                  Kelley Steven-Waiss

                  Kelley Steven-Waiss has served as a Director since August 2015. Ms. Steven-Waiss is currently the Chief Executive Officer of Hitch Works Inc., a talent mobility platform that uses artificial intelligence and machine learning to match project-based opportunities to internal employee skill profiles. Prior to that, Ms. Steven-Waiss served as the Chief Innovation Officer and Human Resources Officer at HERE Technologies Global B.V., a software location intelligence company. She previously served as the Executive Vice President and Chief Human Resources Officer of Extreme Networks, Inc., a software and services-led networking solutions company. Ms. Steven-Waiss also served as the Vice President of Worldwide Human Resources for Integrated Device Technology, Inc., from 2009 through 2012, and prior to that, as the Vice President of Worldwide Human Resources for PMC-Sierra, Inc. Ms. Steven-Waiss also serves as the Chair of the Advisory Board for the Silicon Valley Education Foundation. She earned her M.A. in human resources and organization development from the University of San Francisco and a B.A. in journalism from the University of Arizona.

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • Autonomous Assistants
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Cryogenic Systems
                        • Wafer/Multi-chip Probe Systems
                        • Chip-scale Probe Systems
                        • Cryostats
                        • Vacuum/Pressure Systems
                        • Back
                          • Back
                        • Back
                      • (Integrated Systems)
                      • With KeySight
                        • IMS-K-mmW/THz
                        • IMS-K-SiPh
                        • IMS-K-Power
                        • IMS-K-DC
                        • IMS-K-LFN
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
                      • Type/Application
                        • RF-Front End
                        • 5G mmWave
                        • RF Transceivers
                        • Auto-Radar
                        • High Speed Digital
                        • Back
                      • Platforms
                        • Pyramid RF
                        • Pyrana RF
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
                      • Corporate Citizenship
                      • Diversity & Inclusion
                      • Global Locations
                      • Back
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                      • Back
                    • News & Events
                      • Newsroom
                      • Upcoming Events
                      • Blog
                      • Back
                    • Careers
                      • Career Opportunities
                      • Recruitment Privacy Policy
                      • Back
                    • Related Websites
                      • FRTmetrology.com
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                      • Global Locations
                      • Contact Sales
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                      • Trade-in/Buy Back
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                      • Back
                    • Product Support
                      • FormFactor RMA
                      • Cascade RMA
                      • Probe Systems Support
                      • Analytical Probe Support
                      • Analytical Probe Repair
                      • Pyramid Probe Card Support
                      • WinCal XE Support
                      • Documentation & Downloads
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