Parametric Wafer Acceptance Test
Parametric testing, or wafer acceptance test (WAT), is a unique application for IC manufacturers to ensure that the wafer production process is consistent and maximizes yields. FormFactor's parametric test solutions help to ensure quality.
To reduce the amount of batch processing errors, it is important to confirm that the wafers are being properly fabricated. On larger wafers, process variable control becomes even more critical. With parametric tests, suppliers can develop new wafer process technologies, monitor existing in-line and end-of-line processes, and check wafer-level reliability.
When a new process is being developed, it undergoes a series of tests in a reliability lab. These tests are designed to stress the process with extreme conditions, such as high temperatures and long test periods.