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Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4
                  InfinityXT Probe - Device Characterization Wafer Probe
                  InfinityXT Probe - Next Generation Wafer Probing
                  Products Probes Infinity InfinityXT Probe

                  Cascade

                  InfinityXT Probe

                  Next-generation, high-frequency performance with advanced features

                  InfinityXT Probe - Device Characterization Wafer Probe
                  InfinityXT Probe - Next Generation Wafer Probing
                  OverviewKey FeaturesVideosDownloads

                  InfinityXT Probe Overview

                  Introducing the InfinityXT probe series. InfinityXT enhances and extends FormFactor’s industry-leading Infinity probe family, which has set the benchmark for accuracy and repeatability in the device characterization and modeling community for more than a decade. The new InfinityXT series advances the industry standard with higher temperature range, better tip visibility and durability, and support for narrower pitches as the market evolves.

                  Recently, the industry has experienced explosive growth in the RF and microwave devices, driven by the automotive, mobile communications/5G and IoT device markets. The development of the new InfinityXT probe has been guided by the requirements of these high-growth markets. The requirements include ultra-wide bandwidth and wide temperature ranges for device modeling and characterization. Device measurements for modeling is one of the most demanding on-wafer measurement applications, requiring extremely high measurement accuracy and repeatability, since extracted parameters are highly sensitive to very slight differences.

                  Applications:

                  InfinityXT Probe Key Features

                  InfinityXT Wafer Probe

                  Next Generation Wafer Probing

                  • Continues the Infinity family’s Industry leading electrical
                    performance
                  • High temperature capability (175° C +) for automotive
                    device characterization and other applications
                  • Better tip visibility for enhanced placement accuracy
                    and repeatability
                  • Improved tip life/durability with solid rhodium contacts
                  • New tip architecture enables support for narrower
                    pitches (e.g. 25um)
                  • Advanced mechanical design combined with small
                    contacts enables probing on smaller pads/pitches and
                    improves durability and robustness

                  Videos

                  Autonomous RF Measurement Assistant

                  FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.

                  Autonomous RF Calibration and Wafer Probing Over Temperature at High Frequency

                  Anthony Lord, Director of the RF Market Segment at FormFactor Inc., demonstrates autonomous calibration monitoring and re-calibration over multiple temperatures at frequencies up to 330GHz.


                  Broadband S-parameter Measurement to 130 GHz | Anthony Lord

                  FormFactor RF Market Director Anthony Lord reviews the challenges of making very high frequency measurements over a broad band, especially at millimeter waves. He discusses the need for device modelling and circuit characterization with high accuracy and repeatability, as well as the challenges of making these measurements over temperature (-40 to as high as +175 degrees C).

                  Downloads

                  Icon InfinityXT™ Probe Data Sheet
                  Icon Probe Selection Guide
                  Icon Achieving consistent parameter extraction for advanced RF devices
                  Icon Advanced mm-Wave and Terahertz Measurements with Cascade Probe Stations
                  Icon Autonomous RF Measurement Assistant Brochure
                  Icon Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications

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                  • Products
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                      • (Modular Systems)
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                        • MPS150
                        • Genius Education Kits
                        • Back
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                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
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                          •  
                            •  
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                          •  
                          •  
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                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
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                        • Multi-|Z| Probe
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                        • WPH Probe
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                      • DC POWER
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                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
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                        • Probe Repair
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                        • Back
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                        • PH Series
                        • SmartMatrix
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                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • RF / MMW / RADAR
                        • Katana-RF
                        • Pyrana
                        • Pyramid Accel Test Fixture
                        • Pyramid-MW
                        • Pyramid RF P-Series
                        • Back
                      • CALIBRATION TOOLS
                        • Pyramid Calibration Substrate
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                        • MicroProf® AP
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                        • Back
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                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
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