Explore Our Products
FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from inspection and metrology, characterization, modeling, reliability, and design de-bug, to qualification and production test.
Ideal for device characterization and modeling, Infinity probe combines extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes.
The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity at temperatures as low as 4 K, or as high as 300°C. This capability makes the |Z| probe suitable for the harshest test environments, from cryogenic test and measurement to characterize future computing ICs to high temperatures in closed systems for applications such as automotive devices.
The Air Coplanar Probe is a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. It features excellent probe-tip visibility and the lowest loss available. Available as both single and dual, the ACP probe combines outstanding electrical performance with precise probe mechanics and is todays most widely used microwave probe available.
Our line of RF probes is designed to meet the challenges of high-frequency probing and ensures low and stable contact resistance on aluminum pads.
Our families of calibration substrates supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers.
Our durable, high-performance multi-contact wedge probes streamline RFIC engineering test.
A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz
Multiple configurations for functional circuit testing
Multicontact probe for RFIC engineering test
Test Up to 16 RF Signals with One Probe
Cost-effective, versatile probe card solution
Our range of Multi-contact DC Probes provide high performance power bypassing and flexibility to meet variety of probing requirements and device layouts.
Our DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
Power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power seimconductors up to 60A and 3000V.
Precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards.
We design and buils a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application.