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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
Infinity
Ideal for device characterization and modeling, Infinity probe combines extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes.
|Z| Probe
The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity at temperatures as low as 4 K, or as high as 300°C. This capability makes the |Z| probe suitable for the harshest test environments, from cryogenic test and measurement to characterize future computing ICs to high temperatures in closed systems for applications such as automotive devices.
ACP
The Air Coplanar Probe is a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. It features excellent probe-tip visibility and the lowest loss available. Available as both single and dual, the ACP probe combines outstanding electrical performance with precise probe mechanics and is todays most widely used microwave probe available.
T-Wave
T-Wave Probes set the industry performance standard for on-wafer measurements of millimeter and submillimeter wavelength devices. T-Wave Probes include both waveguide banded probes and broadband (dual band) probes.
Calibration Tools
Our families of calibration substrates supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers.
RF Multicontact
Our durable, high-performance multi-contact wedge probes streamline RFIC engineering test.
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InfinityQuad
A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz
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ACP-Q Probe
Multiple configurations for functional circuit testing
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Unity Probe
Multicontact probe for RFIC engineering test
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Multi-|Z| Probe
Test Up to 16 RF Signals with One Probe
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QuadCard™
Cost-effective, versatile probe card solution
DC Multicontact
Our range of Multi-contact DC Probes provide high performance power bypassing and flexibility to meet variety of probing requirements and device layouts.
DC Parametric
Our DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
DC Power
Our power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power semiconductors up to 600 A and 10,000 V.
Signal Integrity
Precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards.
Specialty
We design and build a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application.
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