The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body maintaining signal integrity over a temperature range from 10 K to 300°C.
Ideal for device characterization and modeling, Infinity probe combines extremely low contact resistance on aluminum pads with unsurpassed RF measurement accuracy for highly reliable, repeatable measurements. Proprietary thin-film and coaxial probe technology reduces unwanted couplings to nearby devices and transmission modes.
Our line of RF probes is designed to meet the challenges of high-frequency probing and ensures low and stable contact resistance on aluminum pads.
Our durable, high-performance multi-contact wedge probes streamline RFIC engineering test.
Our DC probes deliver highly accurate measurements for advanced on-wafer process, device characterization and reliability testing. Our probes offer superior guarding and shielding over-temperature to resolve the performance limitations of non-coaxial and standard coaxial probes.
Our range of Multi-contact DC Probes provide high performance power bypassing and flexibility to meet variety of probing requirements and device layouts.
Power device probes provide a complete on-wafer solution for over-temperature, low-contact resistance measurements of power seimconductors up to 60A and 3000V.
We design and buils a wide variety of custom and specialty probes. If you are unable to find a probe that meets your needs on our website, please contact us and we will be happy to discuss specific requirements for your application.
Precision, durable fine pitch probes, ideal for signal integrity probing on IC packages and circuit boards.
Our families of calibration substrates supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers.