Cascade

PA200 BlueRay

200 mm semi-automated production probe system

Overview Key Features Downloads

PA200 BlueRay Overview

High-Accuracy Throughput

The PA200 BlueRay™ enables high-throughput functional testing of optoelectronic (e.g. LED), MEMS (e.g. pressure sensors) and RF (e.g. SAW/BAW filters) devices. Its precision ensures smooth probe landing with safe, repeatable electrical contact.

The PA200 BlueRay can be easily upgraded in the field with a wafer-handling robot.

Applications: RF/mmW, Opto, MEMS

PA200 BlueRay Key Features

Throughput

Die-to-die stepping time of under 100 ms
Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
Faster time to data

Z-Accuracy

Highest Z-axis resolution of any production prober
Unique Z-profiling function
Even extreme variations in height, such as the case with warped wafers, can be compensated
Minimized scrub
Improved yield

Cost effectiveness

Smallest footprint
Interfaces to all major analysis instrumentation, optics software and testers
Low cost of ownership
Fast return on investment

Double-side option

Backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
Access to top side and bottom side of device under test (DUT)
Highly accurate light measurement

Velox probe station control software

Intuitive GUI
Software joystick for precise, sub-micron positioning
Easy integration with instrument, testers, and test and measurement software
Efficient system utilization by novice and expert users
Prevents damage of probe tips and probe cards throughout the entire measurement cycle
Fast data collection

VeloxPro test automation software

SEMI E95 compliant
Integrates wafer handling, temperature control, z-profiling and stepping in an easy-to-use interface
The fastest, simplest path to automation of the entire test cycle, from wafer loading to data acquisition