Cascade
PA200 BlueRay
200 mm semi-automated production probe system
PA200 BlueRay Overview
High-Accuracy Throughput
The PA200 BlueRay™ enables high-throughput functional testing of optoelectronic (e.g. LED), MEMS (e.g. pressure sensors) and RF (e.g. SAW/BAW filters) devices. Its precision ensures smooth probe landing with safe, repeatable electrical contact.
The PA200 BlueRay can be easily upgraded in the field with a wafer-handling robot.
PA200 BlueRay Key Features
Throughput
- Die-to-die stepping time of under 100 ms
- Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
- Faster time to data
Z-Accuracy
- Highest Z-axis resolution of any production prober
- Unique Z-profiling function
- Even extreme variations in height, such as the case with warped wafers, can be compensated
- Minimized scrub
- Improved yield
Cost effectiveness
- Smallest footprint
- Interfaces to all major analysis instrumentation, optics software and testers
- Low cost of ownership
- Fast return on investment
Double-side option
- Backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
- Access to top side and bottom side of device under test (DUT)
- Highly accurate light measurement
Velox probe station control software
- Intuitive GUI
- Software joystick for precise, sub-micron positioning
- Easy integration with instrument, testers, and test and measurement software
- Efficient system utilization by novice and expert users
- Prevents damage of probe tips and probe cards throughout the entire measurement cycle
- Fast data collection
VeloxPro test automation software
- SEMI E95 compliant
- Integrates wafer handling, temperature control, z-profiling and stepping in an easy-to-use interface
- The fastest, simplest path to automation of the entire test cycle, from wafer loading to data acquisition
Upgradable to fully-automated system (Option)
- Field-upgradable with handling unit
- Test automation out-of-cassette for 24/7 operation
