Cascade
PA200 BlueRay
200 mm semi-/ fully-automated production probe system
PA200 BlueRay Overview
Semi or fully-automated High-Accuracy Throughput
The PA200 BlueRay™ enables high-throughput functional testing of optoelectronic (e.g. LED), MEMS (e.g. pressure sensors) and RF (e.g. SAW/BAW filters) devices. Its precision ensures smooth probe landing with safe, repeatable electrical contact. The PA200 BlueRay is designed for 24/7 operation and can be easily upgraded in the field with a wafer-handling robot.
Applications: RF/mmW, Opto, MEMSPA200 BlueRay Key Features
Throughput
- Die-to-die stepping time of under 100 ms
- Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
- Faster time to data
Z-Accuracy
- Highest Z-axis resolution of any production prober
- Unique Z-profiling function
- Even extreme variations in height, such as the case with warped wafers, can be compensated
- Minimized scrub
- Improved yield
Cost effectiveness
- Smallest footprint
- Interfaces to all major analysis instrumentation, optics software and testers
- Low cost of ownership
- Fast return on investment
Double-side option
- Backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
- Access to top side and bottom side of device under test (DUT)
- Highly accurate light measurement
Velox Probe Station Control Software
- User-centered design minimizes training costs and enhances efficiency
- Comprehensive alignment functions – from simple wafer alignment and mapping to advanced automated probe-to-pad alignment
- Simplified operation for inexperienced users: Reduced training costs with Workflow Guide and condensed graphical user interface
- VeloxPro option: SEMI E95-compliant test executive software that enables simplified and safe automation of the entire wafer test cycle
Upgradable to fully-automated system (Option)
- Field-upgradable with handling unit
- Test automation out-of-cassette for 24/7 operation