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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                • Products
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                    • INFINITY
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                    • |Z| PROBE
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                    • PARAMETRIC
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                    • [ RF Probing ]
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                Asset 4
                  Z-Probe - Coaxial
                  Dual |Z| Probe - Coaxial

                  Cascade

                  |Z| Probe – Coaxial

                  Excellent Performance - Longest Lifetime

                  Z-Probe - Coaxial
                  Dual |Z| Probe - Coaxial
                  OverviewKey FeaturesDownloads

                  |Z| Probe - Coaxial Overview

                  The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body, maintaining signal integrity at temperatures as low as 4 K, or as high as 300°C. This capability makes the |Z| probe suitable for the harshest test environments, from cryogenic test and measurement to characterize future computing ICs to high temperatures in closed systems for applications such as automotive devices.

                  Contacting the device under test (DUT) with the |Z| Probe is simple, highly repeatable and requires significantly less overtravel than alternative RF wafer probes. This is due to the robust design of the coplanar contact structure and the elimination of micro-coax cable. Additionally, the contacts can move independently of one another, which allows you to probe on three-dimensional structures and on wafers with pad-height deviation of up to 50 µm.

                  For differential, cryogenic, multi-port and mixed-signal applications, the Dual |Z| Probe and Multi |Z| Probe are available.

                  The new 1MXTM Technology is an enhancement to the |Z| Probe family of RF and microwave wafer probes. It is based on a significant miniaturization of the CPW (coplanar waveguide) structure which leads to a higher bandwidth capability and better electrical performance by keeping in parallel the unique |Z| Probe advantages like robustness, contact quality, and repeatability.

                  |Z| Probe - Coaxial Key Features

                  • Best price per contact – typically over one million (1,000,000) touchdowns
                  • RF/Microwave signal is shielded and completely air isolated in the probe body
                  • Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
                  • Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
                  • Probe on any pad material with minimal damage

                  Downloads

                  Icon |Z| Probe Family Overview
                  Icon |Z| Probe Quick Reference Guide
                  Icon |Z| Probe 10 GHz Datasheet
                  Icon |Z| Probe 20 GHz Datasheet
                  Icon |Z| Probe 50 GHz Datasheet
                  Icon |Z| Probe 67 GHz Datasheet
                  Icon Dual |Z| Probe Datasheet
                  Icon Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • Autonomous Assistants
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Cryogenic Systems
                        • Wafer/Multi-chip Systems
                        • Chip-scale Systems
                        • IQ1000 SQUID Microscope
                        • Cryostats
                        • Vacuum/Pressure Systems
                        • Back
                          • Back
                        • Back
                      • (Integrated Systems)
                      • With KeySight
                        • IMS-K-mmW/THz
                        • IMS-K-SiPh
                        • IMS-K-Power
                        • IMS-K-DC
                        • IMS-K-LFN
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
                      • Type/Application
                        • RF-Front End
                        • 5G mmWave
                        • RF Transceivers
                        • Auto-Radar
                        • High Speed Digital
                        • Back
                      • Platforms
                        • Pyramid RF
                        • Pyrana RF
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
                      • Corporate Citizenship
                      • Diversity & Inclusion
                      • Global Locations
                      • Back
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                      • Back
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                      • Upcoming Events
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                      • Back
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                      • Recruitment Privacy Policy
                      • Back
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                      • FRTmetrology.com
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                    • Back
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                      • Global Locations
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                      • Back
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                      • Cascade RMA
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                      • Analytical Probe Repair
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                      • WinCal XE Support
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