Scanning SQUID Microscopy – Eliminate the guesswork in the design of resilient superconducting circuits
July 13, 2021 | 9:00am PT/ 12:00pm ET
July 14, 2021 | 9:00am CST
FormFactor invites you to learn more about scanning SQUID microscopes – their history, applications, and the latest advances for superconducting quantum computing applications. Join IBM Research Division and Stanford University emeritus Dr. John Kirtley, a world-renowned expert who helped develop the technique of scanning SQUID microscopy, and FormFactor’s Dr. Ryan Murdick, Cryogenic Product Development Scientist, who collaborated on developing the industry’s first fully automated, cryogen-free Scanning SQUID Microscope, the IQ1000. By employing SQUIDs capable of magnetometry and susceptometry, the system allows measurements of local magnetization, magnetic response (susceptometry), and the ability to spatially map electrical currents from the magnetic response. Researchers can now rapidly locate and capture detrimental magnetic vortices in superconducting circuits to enable operationally robust IC design and help accelerate the growth of the superconducting quantum computing market.
In this webinar, you will learn:
- What is a scanning SQUID microscope?
- Applications for scanning SQUID technology, and why it’s important for superconducting quantum IC design and characterization.
- The latest advances from FormFactor IQ1000 to enable unattended and high-throughput magnetometry and susceptometry measurements including:
- Automated, fast (five-minute) SQUID tuning
- The ability to measure a large sample (20mm x 20mm) or nine samples (5mm x 5mm) simultaneously in one cool-down
- Superb image quality scanning with sub-100 nm precision, as well as repeatable sub-space scanning and position hold for spectroscopy and vortex manipulation.
- Sample temperature control from <3 K to over 20 K with precise, programmable heating and cooling rates.
About the hosts:
Prof. John Kirtley, Ph.D., consulting professor, Applied Physics Department, Stanford University
John Kirtley has worked in the fields of Surface Enhanced Raman scattering, light emissions from tunnel junctions and electron injection devices, noise in semiconducting devices, scanning tunneling microscopy and scanning SQUID microscopy. Since 2006 he has worked at the University of Twente in the Netherlands, been an Alexander von Humboldt Foundation Forschungspreis winner at the University of Augsburg in Germany, a Jubileum Professor at Chalmers University of Technology in Sweden, and currently holds a Chaire d'Excellence from the NanoSciences Fondation in Grenoble, France.
Kirtley shared the 1998 Oliver E. Buckley Prize with C.C. Tsuei, Donald Ginsberg, and D.J. van Harlingen. The citation was for "using phase-sensitive experiments in the elucidation of the orbital symmetry of the pairing function in high-Tc superconductors". Kirtley, Tsuei, and co-workers used scanning SQUID imaging of the half-integer flux quantum effect in tricrystal samples to demonstrate that cuprate high temperature superconductors have predominantly d-wave pairing symmetry. He received his BA in Physics in 1971 and his PhD in Physics in 1976, both from the University of California, Santa Barbara.
Ryan Murdick, Ph.D., Product Development Manager, FormFactor, Inc.
Dr. Ryan Murdick has worked in cryogenic instrumentation for more than a decade; specifically, Scanning Probe Microscopy. He has built more than 25 custom SPM systems for cryogenic environments. Past employers include Montana Instruments and RHK Technology and he has consulted for Quantum Design, Prime Nano, and Molecular Vista. Dr. Murdick earned a PhD in Physics from Michigan State University in the field of Ultrafast Electron Diffraction and was a postdoctoral researcher at the University of Washington in the field of Nano Optics.
Advances in Analytical Wafer Probing of High-voltage / High-current Devices
July 15, 2021 | 9:00am PT/ 12:00pm ET
July 15, 2021 | 9:00am CST
With electric vehicles and other high-power applications gaining momentum, the development of new high-voltage/high current semiconductor devices is ramping up. Wafer test of these power semiconductors poses unique challenges, with test currents of more than 500 Amps and test voltages up to 10 Kilovolts. Designers of these new devices are pushing the limits of physics by shrinking the distance between contacts and requiring test temperatures up to 200° C. In addition, new materials such as silicon carbide and gallium nitride are growing in popularity, adding new complexity to carry out testing in an environment that suppresses electrical arcing, provides low contact resistance of the probe to the device, and low contact and thermal resistance with uniformity between the wafer and chuck. Analytical and engineering probing is key in the research and development of these leading edge semiconductor technologies.
In this webinar, Rainer Gaggl, Founder and Managing Director of T.I.P.S. Messtechnik GmbH (specialists in the design and manufacturing of high-power wafer probe cards), and FormFactor’s Eric Wilcox, Director of Product Marketing, discuss these wafer test challenges and patented high voltage arc suppression technology that provides spark-free probing for high-voltage / high-current devices made with Si, SiC and GaN technology.
About the hosts:
Eric Wilcox, Director, Marketing, DC and High-Power Market Segments, FormFactor, Inc.
Eric Wilcox is the Director of Marketing for FormFactor’s DC and High-Power Market Segments. Mr. Wilcox has held multiple organizational roles within the company, including Senior Marketing Manager for the Probe Systems business and Product Marketing Manager for the Reliability Test Systems business. Prior to this, Mr. Wilcox was a Senior Applications Engineer in the Center of Expertise at Cascade Microtech, Inc., and was responsible for the worldwide technical leadership of Reliability Test Products. Mr. Wilcox has co-authored multiple papers with industry experts about next generation reliability test methodologies for presentation at some of the premier IEEE reliability conferences and has obtained a US patent for innovative systems and methods of performing electromigration testing. Mr. Wilcox holds a Bachelor of Science in Business Management from the University of Northwestern – St. Paul.
Rainer Gaggl, Founder and Managing Director, T.I.P.S. Messtechnik GmbH
Rainer Gaggl is managing director of T.I.P.S. Messtechnik GmbH and responsible for product and process development as well as strategic sales activities. Mr. Gaggl founded T.I.P.S. in 1997 as a "spin-off" of Siemens Bauelemente; the company today has grown to a more than 80-person workforce headquartered in Villach, Austria. The main focus of his work is on test interfaces for high power devices, automotive ASICS, sensors and MEMS devices, and automotive RADAR. High voltage, high currents and probe cards with sensor stimuli are some of his "playgrounds as a physicist" and he holds several patents in that field. He holds a Ph.D. in Physics from the Technical University of Graz.
Unattended RF Measurement and Calibration for 5G Device Characterization and More
Available for on demand viewing
New generations of 5G devices can have dozens of RF channels operating at high frequency, creating a need for a greater on wafer test volume. In engineering, more device tests are needed to support the expanded speed bands, increasing the workload to complete testing. How can test engineers manage the load? What if the probers could operate unattended -- start a test and measure during a whole shift, overnight, or even over the weekend? There is a real, hands-free solution that provides fast, accurate measurements with high throughput -- leading to more accurate design models and faster time to market.
Learn how an autonomous wafer probe system with integrated components from Keysight and FormFactor can:
- Automatically perform wafer and die soaks to get the probes quickly to consistent operating temperature
- Quickly and automatically clean probes and then calibrate at mmw frequencies without user input
- Adjust automatically to multiple probe-to-probe spacings for different device geometries in a single test run
- Monitor calibration drift and recalibrate on the fly when necessary
- Work seamlessly for full temperature range -60 to 175C operation using N5291A Solution, from Keysight technologies, providing single sweep operation of 900 Hz to 130 GHz, and beyond this using Virginia diodes Waveguide mini modules and waveguide probes
About the hosts:
Gavin Fisher | Senior Applications Engineer at FormFactor Inc.
Gavin Fisher is a member of the Centre of Expertise group at FormFactor, providing application support and technical services to FormFactor’s customers. With more than 2 decades of experience working with Cascade probe systems, and with his deep technical knowledge in a broad spectrum of applications such as high-frequency measurement, measurement automation, calibration and power device measurement, he educates and trains customers on best practices to achieve accurate measurement results. He has made several presentations at European Microwave Week, MOS-AK workshops, and Agilent/Keysight seminars.
Prior to joining FormFactor, Gavin served as a Mechanical Engineer at Alenia Marconi Systems. He holds an upper-second degree from Brunel University in Mechanical Engineering with electronic systems.
Suren Singh | Technical Lead Emerging Technologies at Keysight Technologies
Suren Singh received his BSEE from University of Durban-Westville, Durban South Africa in 1985. He completed a Graduate Diploma at the University of Witwatersrand, Johannesburg South Africa in December 1992. He then went on to complete his MSEE at the University of Witwatersrand, Johannesburg in 1995. Suren has been with the Hewlett-Packard Company, Agilent Technologies and now Keysight Technologies since 1986. His experience includes application engineering, product design, manufacturing, and test process development for microwave hybrid microcircuits. He also held the position of an application specialist and system architect, focused on the terahertz measurement solutions for Keysight. In addition, he is responsible for the metrology products for performance network analyzers, including both calibration and verification as applied to both ambient
and cryogenic temperatures. More recently Suren has been appointed as the technical lead for the emerging technologies for Quantum and 6G focused on the aerospace industry. More recently Suren has been involved in the development of solutions for cryogenic component testing for the Quantum based systems. He is also working closely with the industry leaders in millimeter wave space to bring to market solutions focused on 6G component characterization.
Delivering Advanced mm-Wave Load-Pull Measurements
Available for on demand viewing
The ramp-up of 5G mm-Wave technologies comes with substantial enhancements in connectivity, promising to revolutionize our world. A fundamental requirement of 5G devices is to maximize performance by optimizing the power and/or effciency of the amplifiers and transistors. This is done by measuring the performance characteristics of the device at different impedances that are systematically changed using load-pull tuners.
FormFactor has partnered with Focus Microwaves and Keysight Technologies to deliver a fully integrated probe solution for accurate on-wafer mm-Wave load-pull measurements, delivering a number of benefits along the way, including:
- Low-Loss Measurement Channel for Maximized Tuning Range
- Accurate Probing of Small Pads for High Resolution with a Perfect Fit
- Coaxial Calibration with the Highest Phase Stability
- EMI and light-tight testing at a wide temperature range, including tests down to -40°C without a build-up of frost and condensation.
About the hosts:
Anthony Lord | Director, RF Segment Business Development at FormFactor Inc.
Anthony Lord is Director, RF Segment Business Development for FormFactor’s Systems Business Unit. Anthony has been involved in many organizational roles within the company, including applications engineering, sales management, product line management, strategic marketing as well as segment marketing, and has been actively involved in the semiconductor and RF industry for 24 years. Anthony has published several papers on RF on-wafer measurements, and has hosted numerous workshops and presentations on on-wafer test applications. Currently, Anthony is exploring where the RF semiconductor market is heading, and how to position future products to enable engineers to make the most accurate measurements with the fastest time to data.
Vince Mallette | Executive Vice President at Focus Microwaves
Vince Mallette receieved his B.Sc from the University of Quebec - ETS in Montreal, Quebec, Canada in 2004. He has over 15 years of industry experience with Agilent (now Keysight), Focus Microwaves group pursuing product innovation, development and strategic business development. Currently he is the Executive Vice President of Focus Microwaves and heads all major business initiatives in terms of partnerships and growth on technology evaluation front. He has supported all different foundries ranging from silicon to III-V technologies from sub 6 GHz to mm-wave frequencies and innovation in tuner space from single frequency to harmonic tuner enabling high performance out of the device. He has authored and coauthored over 10 referred publications.