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Cascade Probe Systems

Probe systems

We offer a complete line of premium performance analytical probe solutions for on-wafer probing, board test and package test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

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    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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              Asset 4
                Products Probes ACP ACP Probe – Coaxial

                Cascade

                ACP Probe – Coaxial

                Long-lasting, rugged RF and microwave on-wafer probes

                OverviewKey FeaturesDownloads

                ACP Probe - Coaxial Overview

                The Air Coplanar Probe (ACP) is a rugged microwave probe with a compliant tip for accurate, repeatable measurements for both on-wafer as well signal integrity applications. It features excellent probe-tip visibility and the lowest loss available. The ACP Probe delivers outstanding compliance for probing non-planar surfaces. These probes offer stable and repeatable over-temperature measurements, with a typical probe life of 500,000 contacts on gold pads. Configurations for both single and dual signal applications are available. The ACP probe combines outstanding electrical performance with precise probe mechanics, and is today’s most widely used microwave probe. Fast delivery is available on 100, 125, 150, 200, and 250 µm pitched probes

                ACP Probe - Coaxial Key Features

                • Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
                • DC to 110 GHz models available in single and dual line versions
                • Low insertion and return loss with ultra-low-loss ( -L ) versions
                • Excellent crosstalk characteristics
                • Wide operating temperature -65 ° C to + 200 ° C
                • Wide range of pitches available, from 50 to 1250 µm
                • Individually supported contacts
                • Reduced contact (RC) probe tips for small pads
                • BeCu tip provides rugged, repeatable contact on gold pads

                Downloads

                ACP Quick Guide
                Probe Selection Guide

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                • Products
                  • Probe Systems
                    • (By Wafer Size)
                    • 150 MM Probe Systems
                      • MPS150/EPS150
                      • RFgenius
                      • Back
                    • 200 MM Probe Systems
                      • PM8/EPS200
                      • BlueRay
                      • Summit
                      • See All…
                      • Back
                    • 300 MM Probe Systems
                      • PM300
                      • CM300
                      • See All…
                      • Back
                    • (By Application)
                    • AUTONOMOUS ASSISTANTS
                      • Autonomous DC
                      • Autonomous RF
                      • Autonomous SiPh
                      • Back
                    • Board Level Systems
                      • Board Test Systems
                      • Back
                    • Reliability Test Systems
                      • 1164
                      • Application Modules
                      • See All…
                      •  
                      •  
                      • Back
                    • Power Systems
                      • Tesla
                      • Back
                    • Advanced Test
                      • Vacuum/Cryo/Pressure Systems
                      • Back
                    • Software
                      • Velox
                      • WinCal XE
                      • Back
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                      • Back
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                      • Back
                    • Back
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                      • Back
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • Infinity Waveguide Probe
                      • Back
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                      • Back
                    • T-WAVE
                      • T-Wave Probe
                      • Back
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                      • Back
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                      • Back
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                      • Back
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                      • Back
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Light Wave Probe
                      • Back
                    • SIGNAL INTEGRITY
                      • FPC Probe
                      • Back
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                      • Back
                    • Back
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                      • Back
                    • FLASH
                      • TouchMatrix
                      • Back
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                      • Back
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                      • Back
                    • RF / MMW / RADAR
                      • Katana-RF
                      • Pyrana
                      • Pyramid Accel Test Fixture
                      • Pyramid-MW
                      • Pyramid RF P-Series
                      • Back
                    • CALIBRATION TOOLS
                      • Pyramid Calibration Substrate
                      • Back
                    • Back
                  • Back
                • Test Expertise
                  • Customer Collaboration
                    • Sharing Expertise
                    • Lab to Fab
                    • Back
                  • Applications
                    • High Bandwith Memory
                    • Silicon Photonics
                    • Back
                  • Technologies
                    • Contact Intelligence
                    • Back
                  • Publications
                    • Technical Papers
                    • Case Studies
                    • Back
                  • MeasureOne Solutions
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • S-Parameter & DC Parametric
                    • Terahertz Probing
                    • Back
                  • Back
                • Company
                  • About Us
                    • Accelerating Profitability
                    • Company Profile
                    • Our History
                    • Leadership
                    • Board of Directors
                    • Corporate Citizenship
                    • Global Locations
                    • Back
                  • Investors
                    • Investor Relations
                    • Back
                  • News & Events
                    • Newsroom
                    • Upcoming Events
                    • Blog
                    • Back
                  • Careers
                    • Career Opportunities
                    • Recruitment Privacy Policy
                    • Back
                  • Back
                • Sales & Service
                  • Contact Us
                    • Global Locations
                    • Contact Sales
                    • Parts & Service Request
                    • Back
                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
                    • Trade-in/Buy Back
                    • Logistics Service
                    • Back
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
                    • Probe Systems Support
                    • Analytical Probe Support
                    • Analytical Probe Repair
                    • Pyramid Probe Card Support
                    • WinCal XE Support
                    • Documentation & Downloads
                    • Back
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