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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                • Products
                  • Probe Systems
                    • (Modular Systems)
                    • 150 MM Probe Systems
                      • MPS150
                      • Genius Education Kits
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                    • INFINITY
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                    • PARAMETRIC
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                    • [ RF Probing ]
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                Asset 4
                  PH Series Probe Card

                  PH Series

                  For integrated, wafer testing with probe head sizes ranging from 50 mm to 100 mm

                  OverviewKey FeaturesDownloads

                  PH Series Overview

                  The latest DRAM chips deliver extremely fast and smooth graphic and cache memory response in game consoles and personal computers, as well as server applications.

                  They afford soaring memory capacity in smaller and smaller cellular phones, IOT and other consumer electronics, as semiconductors get stacked into compact packages of multi-tasking die. Testing these new, high-performance, high-density DRAM devices is optimized with FormFactor’s Matrix and PH-Series wafer probe cards as they improve efficiency and reduce the overall cost of DRAM test.

                  Every single bit must be tested to ensure top performance, making massively parallel wafer-level testing essential to high-yield, volume production at lower overall cost. FormFactor DRAM test solutions’ scalable architecture easily adapts to DRAM chip designs’ ultra-high pin count, wafer sizes and architecture, and makes optimal use of power and low-force, precision contact.

                  Applications:

                  PH Series Key Features

                  • 3D MEMS MicroSpring contact design with high pin count and small pad size capability
                  • Wide temperature compatibility for more controlled probing and faster setup, higher probe card availability and better test throughput
                  • Scalability to 50 um pad pitch
                  • Improved planarization control for superior planarity

                  Downloads

                  Icon Advanced Wafer Probe Cards - Brochure

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • Autonomous Assistants
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Cryogenic Systems
                        • Wafer/Multi-chip Systems
                        • Chip-scale Systems
                        • IQ1000 SQUID Microscope
                        • Cryostats
                        • Vacuum/Pressure Systems
                        • Back
                          • Back
                        • Back
                      • (Integrated Systems)
                      • With KeySight
                        • IMS-K-mmW/THz
                        • IMS-K-SiPh
                        • IMS-K-Power
                        • IMS-K-DC
                        • IMS-K-LFN
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
                      • Type/Application
                        • RF-Front End
                        • 5G mmWave
                        • RF Transceivers
                        • Auto-Radar
                        • High Speed Digital
                        • Back
                      • Platforms
                        • Pyramid RF
                        • Pyrana RF
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
                      • Corporate Citizenship
                      • Diversity & Inclusion
                      • Global Locations
                      • Back
                    • Investors
                      • Investor Relations
                      • Back
                    • News & Events
                      • Newsroom
                      • Upcoming Events
                      • Blog
                      • Back
                    • Careers
                      • Career Opportunities
                      • Recruitment Privacy Policy
                      • Back
                    • Related Websites
                      • FRTmetrology.com
                      • Back
                    • Back
                  • Sales & Service
                    • Contact Us
                      • Global Locations
                      • Contact Sales
                      • Parts & Service Request
                      • Back
                    • Additional Products/Programs
                      • Equipment Financing
                      • Educational Savings
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Logistics Service
                      • Back
                    • Product Support
                      • FormFactor RMA
                      • Cascade RMA
                      • Probe Systems Support
                      • Analytical Probe Support
                      • Analytical Probe Repair
                      • Pyramid Probe Card Support
                      • WinCal XE Support
                      • Documentation & Downloads
                      • Back
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