• Skip to primary navigation
  • Skip to main content

Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

See All Probe Systems

    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

    See All Probe Products

      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

      See All Probe Cards

        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

          Learn More

            Ready to learn more about our products and services?

            Contact Sales

            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

            Learn More

              Ready to learn more about our products and services?

              Contact Sales

              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

              Learn More

                Ready to learn more about our products and services?

                Contact Sales

                • Products
                  • Probe Systems
                    • (Modular Systems)
                    • 150 MM Probe Systems
                      • MPS150
                      • Genius Education Kits
                    • 200 MM Probe Systems
                      • Summit
                      • BlueRay
                      • PM8/EPS200
                      • See All…
                    • 300 MM Probe Systems
                      • CM300
                      • PM300
                      • See All…
                    • (Dedicated Systems)
                    • AUTONOMOUS ASSISTANTS
                      • Autonomous DC
                      • Autonomous RF
                      • Autonomous SiPh
                    • Board Level Systems
                      • Board Test Systems
                    • Power Systems
                      • Tesla
                    • Advanced Test
                      • Vacuum/Cryo/Pressure Systems
                    • Software
                      • Velox
                      • WinCal XE
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                        •  
                          •  
                      •  
                        •  
                        •  
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                    •  
                    •  
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • InfinityXT™ Probe – Coaxial
                      • Infinity Waveguide Probe
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                    • T-WAVE
                      • T-Wave Probe
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Optical Probes
                      • Cryogenic Probes
                    • SIGNAL INTEGRITY
                      • FPC Probe
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                    • Product Support
                      • Probe Support
                      • Probe Repair
                      • WinCal Support
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                    • FLASH
                      • TouchMatrix
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                    • RF / MMW / RADAR
                      • Katana-RF
                      • Pyrana
                      • Pyramid Accel Test Fixture
                      • Pyramid-MW
                      • Pyramid RF P-Series
                    • CALIBRATION TOOLS
                      • Pyramid Calibration Substrate
                  • Metrology
                    • Metrology Systems
                      • MicroProf® AP
                      • MicroProf® FS
                      • MicroProf® FE
                      • MicroProf® MHU
                      • MicroProf® TL
                      • MicroProf® 300
                      • MicroProf® 200
                      • MicroProf® 100
                • Test Expertise
                  • Customer Collaboration
                    • Sharing Expertise
                    • Lab to Fab
                  • Applications
                    • 5G Devices
                    • Advanced Packaging
                    • Cryogenic Devices
                    • DC Parametric Test
                    • Low Frequency Noise
                    • mm-Wave Load-Pull
                    • Power Semiconductors
                    • Silicon Photonics
                    • VCSEL and MicroLED
                  • Technologies
                    • Contact Intelligence
                    • MEMS
                  • Publications
                    • Technical Papers
                    • Case Studies
                    • Test Insights Presentations
                  • MEASUREONE LEADERSHIP ALLIANCES
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • Power Semiconductor Probing
                    • RF Tuning & Load-Pull
                    • S-Parameter & DC Parametric
                    • Silicon Photonics Test
                    • Terahertz Probing
                • Company
                  • About Us
                    • Accelerating Profitability
                    • Company Profile
                    • Our History
                    • Leadership
                    • Board of Directors
                    • Corporate Citizenship
                    • Global Locations
                  • Investors
                    • Investor Relations
                  • News & Events
                    • Newsroom
                    • Upcoming Events
                    • Blog
                  • Careers
                    • Career Opportunities
                    • Recruitment Privacy Policy
                  • Related Websites
                    • FRTmetrology.com
                    • High Precision Devices (HPD)
                • Sales & Service
                  • Contact Us
                    • Global Locations
                    • Contact Sales
                    • Parts & Service Request
                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
                    • Trade-in/Buy Back
                    • Logistics Service
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
                    • Probe Systems Support
                    • Analytical Probe Support
                    • Analytical Probe Repair
                    • Pyramid Probe Card Support
                    • WinCal XE Support
                    • Documentation & Downloads
                  • Portal Sign In
                    • Sales Portal
                    • Service Portal
                Asset 4
                  WPH Probe
                  Products Probes DC Multicontact WPH Probe

                  Cascade

                  WPH Probe

                  Multi-contact DC Probe with full-radius needles

                  OverviewKey FeaturesDownloads

                  WPH Probe Overview

                  The WPH probes feature up to 12 ceramic-bladed, nickel-plated, tungsten needles with a 2 x 12 square pin cable interface. The circuit board has been laid out such that both series and shunt components can be added to the signal path of each needle.

                  Applications:

                  WPH Probe Key Features

                  • Full-radius, nickel-plated tungsten needles
                  • Power bypass inductance: 16 nH
                  • Supports collinear and non-standard needle configurations
                  • Support up to a maximum of 12 ceramic blades DC needles / contacts
                  • Ideal for probing the entire circuit for functional test
                  • DC probes can provide power or slow logic to circuit under test

                  Downloads

                  Icon Probe Selection Guide
                  Icon Quadrant Probe Design Capture Form
                  Icon Layout Rules for GHz-Probing

                  Customer Care

                  Ready to learn more about FormFactor products and services?

                  Contact Sales Today
                  • Company
                  • Company Profile
                  • Investor Relations
                  • Newsroom
                  • Our History
                  • Leadership
                  • Board of Directors
                  • Corporate Citizenship
                  • Blog
                  • Careers
                  • Career Opportunities
                  • Recruitment Privacy Policy
                  • Sales & Service
                  • Global Locations
                  • Products
                  • Probe Systems
                  • Probes
                  • Probe Cards

                  Social Media

                  LinkedIn Facebook YouTube
                  • Privacy Policy
                  • Web Terms of Use

                  ©2021, FormFactor. All Rights Reserved.

                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • AUTONOMOUS ASSISTANTS
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Advanced Test
                        • Vacuum/Cryo/Pressure Systems
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • RF / MMW / RADAR
                        • Katana-RF
                        • Pyrana
                        • Pyramid Accel Test Fixture
                        • Pyramid-MW
                        • Pyramid RF P-Series
                        • Back
                      • CALIBRATION TOOLS
                        • Pyramid Calibration Substrate
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
                      • Corporate Citizenship
                      • Global Locations
                      • Back
                    • Investors
                      • Investor Relations
                      • Back
                    • News & Events
                      • Newsroom
                      • Upcoming Events
                      • Blog
                      • Back
                    • Careers
                      • Career Opportunities
                      • Recruitment Privacy Policy
                      • Back
                    • Related Websites
                      • FRTmetrology.com
                      • High Precision Devices (HPD)
                      • Back
                    • Back
                  • Sales & Service
                    • Contact Us
                      • Global Locations
                      • Contact Sales
                      • Parts & Service Request
                      • Back
                    • Additional Products/Programs
                      • Equipment Financing
                      • Educational Savings
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Logistics Service
                      • Back
                    • Product Support
                      • FormFactor RMA
                      • Cascade RMA
                      • Probe Systems Support
                      • Analytical Probe Support
                      • Analytical Probe Repair
                      • Pyramid Probe Card Support
                      • WinCal XE Support
                      • Documentation & Downloads
                      • Back
                    • Portal Sign In
                      • Sales Portal
                      • Service Portal
                      • Back
                    • Back

                  [ Placeholder content for popup link ] WordPress Download Manager - Best Download Management Plugin

                  IMPORTANT NOTIFICATIONS TO FORMFACTOR EMPLOYEES REGARDING COVID-19

                  • English
                  • Japanese
                  • Chinese Simplified

                  We've updated our Privacy Policy.

                  Our policy describes the use of cookies and similar technologies on this website. It also describes how we use any personal data we collect. Click “Agree” (below) to consent to this use. To learn more, please read the FormFactor Privacy Policy.