For 200 mm and 300 mm
NAND and NOR Flash wafer testing
Fluctuating price and demand routinely require Flash memory manufacturers to find new operating efficiencies. FormFactor advanced wafer test solutions help manufacturers address that pressure, by improving yield and reducing overall cost of test per die.
The FormFactor TouchMatrix™ wafer probe solution is designed specifically to deliver the lowest overall test cost per die for 200 mm and 300 mm NAND and NOR Flash wafer testing. It provides massive parallelism and adjusts to variations in manufacturers’ test equipment and product designs, to optimize probe planarity and speed set-up. Together, these features improve productivity and reduce the total cost of ownership.
TouchMatrix Key Features
- One-touchdown probing
- Field-adjustable planarity
- Efficient, high-integrity electrical test