IMS-K-LFN
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
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Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
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Contact Sales TodayComprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA
for On-wafer R&D Advanced Low-Frequency Noise Measurements
FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including:
Industry’s Most Productive and Accurate Advanced Low-Frequency Noise Measurement System
On-wafer 1/f noise measurements are a critical component of any characterization and modeling test system. Due to the required sensitivity, such testing can be easily corrupted by interference from outside or inside the test system. Overcoming these challenges requires carefully designed equipment from the industry’s foremost test and probe solution providers, cooperating to provide highly sensitive measurements in an ultra-low spectral noise environment. Tightly integrated instrumentation from industry leader Keysight completes the system to deliver best possible measurement accuracy and repeatability.
Fastest, Safest, and Most Affordable Path to High Quality Measurements
Pre-validated, turn-key, comprehensive, integrated measurement systems from FormFactor deliver peace of mind and immediate, out-of-the-box productivity for important test applications.
These benefits are provided at no extra cost. IMS solutions from FormFactor include no markups over Keysight pricing or integration charges.
Only one advanced low-frequency noise measurement system in the world is built upon the foundations of the #1 leader in R&D instrumentation plus the #1 leader in analytical probe systems – the FormFactor IMS-K-LFN.
Applications: Low-Frequency Noise