Probe Station Control Software
Velox 3 Overview
Windows 10 compatible – User-centered design – Efficient and robust. Experience the new Velox™ 3 probe station control software!
Velox™ is FormFactor’s unique software suite for 200 mm and 300 mm wafer probe stations. It is the universal standard for semi- and fully-automated systems, enabling seamless communication between the user and more than 15 different platforms.
Velox reduces total cost of ownership by minimizing training efforts and providing faster time to robust and reliable data. As a key element of FormFactor’s exclusive Contact Intelligence™ technology for autonomous operation, it allows the user to perform measurement tasks faster, safer and more accurately. Velox enables safe and fast wafer loading, easy test automation and measurement system integration, while preventing costly damage of probes and probe cards throughout the entire measurement cycle.
Velox is installed on more than 600 FormFactor probe stations. Strong customer relationships and continuing advancements make Velox software the clear leader in probe station control.
New in Velox 3
|User-centered Design with New Icons and Skins
For a modern look-and-feel we introduced a new color concept. All icons were thoroughly redesigned and are now better identifiable. Still, they are at the same place as before and instantly recognizable. Process- and safety-relevant information – such as the contact or the different stages in the Control Center – is clearly highlighted. Additionally, it is now easier to distinguish between application icons – such as Spectrum or SetupTool, and functional icons – such as AutoAlign or Light on/off.
|Windows 10 Compatible
Velox 3 is designed for Windows 10. This guarantees a highest-performance and safe operation with state-of-the-art hardware and interfaces such as USB3 Vision. Additionally, the innovative, intuitive and widely-used Windows Fluent Design System is adopted for several Velox functions, such as the SetupTool.
A loader can now be operated directly with Velox. There is no need for any additional software. The creation of workflows and receipts is as simple as it can get. This drastically improves the operation with fully-automated probe stations that include a loader, reducing time and training efforts.
Velox 3 Key Features
CONTACT INTELLIGENCE TECHNOLOGY
Non-Stop Autonomous Semiconductor Test
With FormFactor’s unique Contact Intelligence technology, Velox 3 enables 24/7 autonomous semiconductor test. Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide range of applications. This allows lengthy test routines to be performed overnight or the weekend without operator intervention – even over a wide temperature range. Contact Intelligence accelerates time to accurate data, time to market and ultimately – time to profitability.
Improving your Production Processes
SECS/GEM interfaces are a SEMI-standard industry-specific integration layer for semiconductor production. SECS/GEM interfaces establish the connection between the system and the higher level. Production and plant data, alarms, process values, process parameters etc. are transferred via SECS/GEM.
Quickest Wafer Alignment and Mapping
Velox AutoAlign is the most ergonomic and quickest way to align a wafer in X, Y and theta and determine the wafer diameter and die size. It generates a wafer map corresponding to the evaluated die indices and number of recognized dies in both axes.
VueTrack™ enables unattended testing over multiple temperatures for positioners or probe cards by automaticall aligning probes to pads, utilizing the eVue Pro microscope. VueTrack eliminates the need for manual re-adjustment and ensures constant contact quality.
Automatically Aligning Probe to Pads
ReAlign™ enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.
CellView allows you to easily navigate and orientate on parts of the wafer that are out of view.
Easy Step-by-Step Guidance
The Velox Workflow Guide enables unexperienced users to perform successful measurements by guiding the operator step-by-step through different processes, no matter if these are simple procedures or complex measurements.
VELOX SETUP TOOL
All Global Settings in One Place
The Velox Setup Tool combines all global Velox settings in one place – from autostart preferences, interface and device settings to license management. This simplifies the setup process, reduces training needs and safes time. Further Velox settings, such as for Control Center, WaferMap and Spectrum, will be successively integrated into the Setup Tool with the next Velox versions.
The all new Velox 3 probe station control software
Windows 10 compatible – User-centered design – Efficient and robust. Experience the new Velox 3 probe station control software for 200 mm and 300 mm semi- and fully automatic probe stations.
Velox AutoAlign is the most ergonomic and quickest way to align a wafer in theta and determine the wafer diameter and die size.
VueTrack™ is an exclusive Velox feature that supports Contact Intelligence™ Technology. It enables unattended testing over multiple temperatures for positioners or probe cards by automatically aligning probes to pads. VueTrack eliminates the need for manual re-adjustment and ensures constant contact quality.
ReAlign is a powerful Velox feature that is supports Contact Intelligence Technology™. It enables unattended testing over multiple temperatures for probe cards on the CM300xi by automatically aligning probe to pads. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.
Autonomous RF Measurement Assistant
FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.
With our exclusive patented RF TopHat, motorized positioners and intelligent software algorithms, the solution runs over days without an operator – constantly monitoring calibration accuracy and ensuring measurement certainty for every device measurement. With more test data and higher accuracy, the Auto RF Measurement Assistant reduces cost of test, minimizes training needs and accelerates time to market.
The Autonomous RF Measurement Assistant is available for our 300 mm and 200 mm wafer probe stations CM300xi, SUMMIT200, Summit 12000 and Elite.