Ultra High-Power (UHP)
Enabling single-contact high-current/high-voltage test
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Enabling single-contact high-current/high-voltage test
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Contact Sales TodayThe UHP probe allows wafer-level power device characterization in both high-current and high-voltage conditions with one touchdown and one setup. By eliminating the need for multiple probes and multiple measurement setup changes, the UHP probe enables easy, fast measurements of IGBT and MOSFET high-power devices at the wafer level, increasing throughput and improving measurement repeatability. Together with Tesla on-wafer power device characterization system, the UHP probe allow you to fully utilize the high-voltage/current switching capability of the latest ultra-high current and ultra-high voltage expander units.
TESLA200 - 200mm High Power Probe System
The TESLA200 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables collection of accurate high voltage and high current measurement data, with complete operator safety.