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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4
                  InfinityQuad - Multi-contact RF/mmW Probe

                  Cascade

                  InfinityQuad

                  A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz

                  OverviewKey FeaturesDownloads

                  InfinityQuad Overview

                  For repeatable and precise engineering tests of DC, logic, RF and mmWave RFIC devices, the InfinityQuad™ probe ensures reliable measurement results up to 110 GHz over a wide temperature range (-40 °C to 125 °C). The durable photo-lithographically defined fine-pitch tip structure enables probing of small pads down to 30 x 50 μm with minimum pad damage and consistent low contact resistance. The durable probe tips with small contact area of ~10 μm diameter ensure more than 250,000 touchdowns on Al pads, and provide accurate X, Y and Z alignment.

                  Pads as small as 30 μm x 50 μm become a reality in automated over-temperature probing applications. This allows the user to reduce pad sizes, saves device real estate space and lowers pad parasitics – both saving money and improving measurement accuracy.

                  InfinityQuad technology reduces the minimum size of the pad that can be used with a multi-contact, mixed-signal probe. And for customers already using small pads, you can repeatedly make contact with the pad – reducing the amount of time needed to manually test or eliminating the need to repeat automatic tests due to probes skating off the pads.

                  Use our online tool to capture your design requirements and receive a quote.

                  InfinityQuad Key Features

                  • Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
                  • Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
                  • Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
                  • Durable probe structure ensures more than 250,000 contacts
                  • Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications

                  Downloads

                  Icon InfinityQuad Probe Datasheet
                  Icon InfinityQuad ProbePAD Layout Rules
                  Icon InfinityQuad Tech Brief: Addressing the Challenges of Small Pad Probing
                  Icon InfinityQuad Probe: N+1-port SOLT/SOLR calibration
                  Icon How InfinityQuad™ Probes Help DICE Characterize Mixed-Signal Devices with Small Pads
                  Icon Improving Wafer-Level S-parameters Measurement Accuracy and Stability with Probe-Tip Power Calibration up to 110 GHz for 5G Applications

                  Use our online tool to capture your design requirements and receive a quote.

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • Autonomous Assistants
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Cryogenic Systems
                        • Wafer/Multi-chip Systems
                        • Chip-scale Systems
                        • IQ1000 SQUID Microscope
                        • Cryostats
                        • Vacuum/Pressure Systems
                        • Back
                          • Back
                        • Back
                      • (Integrated Systems)
                      • With KeySight
                        • IMS-K-mmW/THz
                        • IMS-K-SiPh
                        • IMS-K-Power
                        • IMS-K-DC
                        • IMS-K-LFN
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • [ RF Probing ]
                      • Type/Application
                        • RF-Front End
                        • 5G mmWave
                        • RF Transceivers
                        • Auto-Radar
                        • High Speed Digital
                        • Back
                      • Platforms
                        • Pyramid RF
                        • Pyrana RF
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
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