150 mm Systems
The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm. Pre-configured application-focused probing solutions are available with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The MPS150 is the industry’s probe platform of choice.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade 200 mm wafer probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
300 mm Systems
Cascade 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
Autonomous Assistants
FormFactor’s Contact Intelligence technology combines smart hardware design and innovative software algorithms to provide accurate probe-to-pad alignment and electronic recalibrations in engineering labs and many production applications. FormFactor now has specialized Contact Intelligence assistants for autonomous RF, DC and Silicon Photonics (SiPh) testing.
Board Test Systems
We offer affordable and complete horizontal and vertical board test systems, enabling precision electrical measurements of IC packages and circuit boards.
Reliability Test Systems
Cascade reliability test systems grow with your needs. Whether you start with the Symphony test system for small WLR applications or the 1164 test system for large PLR or WLR applications - the modular, scalable design allows easy expansion in the future
Power Systems
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
Vacuum/Cryo Systems
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
Accessories
Software
We offer several unique software solutions that enhance the functionality of your wafer-level test system
Custom Probe Systems
Customized solutions for a variety of challenging applications
