150 mm Systems
Easy – flexible – future proof: Customize your 150 mm manual probe station with application-specific starter kits at an incredible price starting at $13,880.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade 200 mm manual and automated wafer probe stations have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
FormFactor’s Contact Intelligence technology combines smart hardware design and innovative software algorithms to provide accurate probe-to-pad alignment and electronic recalibrations in engineering labs and many production applications. FormFactor now has specialized Contact Intelligence assistants for autonomous RF, DC and Silicon Photonics (SiPh) testing.
Board Test Systems
We offer affordable and complete horizontal and vertical board test systems, enabling precision electrical measurements of IC packages and circuit boards.
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. FormFactor offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
We offer several unique software solutions that enhance the functionality of your wafer-level test system
Custom Probe Systems
Customized solutions for a variety of challenging applications