150 mm Systems
The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm. Pre-configured application-focused probing solutions are available with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The MPS150 is the industry’s probe platform of choice.
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MPS150
EPS150 COAX / COAXPLUS
EPS150TRIAX
EPS150RF
EPS150MMW
EPS150FA
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade Microtech's 200 mm wafer probing systems have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
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PM8
EPS200RF
EPS200MMW
PA200
PA200 BlueRay
PA200 BlueRay with MHU
Summit – Manual
Summit – Semi-automated
300 mm Systems
Cascade 300 mm probing solutions set the standard for on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
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PM300PS
PM300
CM300-O
CM300-O with MHU
CM300xi
CM300xi with MHU
Board Test Systems
We offer affordable and complete horizontal and vertical board test systems, enabling precision electrical measurements of IC packages and circuit boards.
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Board Test System
Reliability Test Systems
Cascade reliability test systems grow with your needs. Whether you start with the Symphony test system for small WLR applications or the 1164 test system for large PLR or WLR applications - the modular, scalable design allows easy expansion in the future
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Estrada
Estrada-EM
Symphony WLR Test System
1164 Reliability Test System
Application Modules
Power Systems
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. Cascade offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
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EPS150TESLA
APS200TESLA
TESLA200 – Manual
TESLA200 – Semi-Automated
TESLA300 – Semi-Automated
Vacuum/Cryo Systems
For MEMS devices that require test in a high vacuum or controlled pressure environment, and for IR imaging devices or cutting edge technologies that require testing at cryogenic temperatures, our special vacuum, pressure and cryogenic probe stations enable precise on-wafer measurements in extreme environments.
Dedicated Systems
Optimized Systems solve complex measurement challenges
Integrated systems provide a complete solution for complex measurement problems that cannot be solved with just a collection of piece parts. Each part of the integrated solution is optimized and fine tuned to work together, enabling fast accurate on-wafer data collection for complex application and measurement needs. Integrated Systems are build upon high performance probe stations, giving you the ease of use and full featured on-wafer probing experience that has made our probe systems the #1 choice of customer throughout the world. And each turnkey solution includes everything you need in one system, including a variety of highly optimized on-wafer probes, test instrumentation & cabling configurations, and software tools, ready to go.
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Software
We offer several unique software solutions that enhance the functionality of your wafer-level test system
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Velox
Accessories
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Positioners
Chucks
eVue Microscope
Pressure Probe Module
ShieldEnclosure™
Vibration Isolation Tables
Certified Used Equipment
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