Explore Our Products
FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from inspection and metrology, characterization, modeling, reliability, and design de-bug, to qualification and production test.
150 mm Systems
Easy – flexible – future proof: Customize your 150 mm manual probe station with application-specific starter kits at an incredible price starting at $13,880.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, Cascade 200 mm manual and automated wafer probe stations have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
Advanced 200 mm semi-/ fully-automated probe system
200 mm manual/ semi-automated probe system
200 mm semi-/ fully-automated production probe system
200 mm manual open probe system
200 mm manual probe system for RF test up to 67 GHz
mmW probing up to THz and load-pull
300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
FormFactor’s Contact Intelligence technology combines smart hardware design and innovative software algorithms to provide accurate probe-to-pad alignment and electronic recalibrations in engineering labs and many production applications. FormFactor now has specialized Contact Intelligence assistants for autonomous RF, DC and Silicon Photonics (SiPh) testing.
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. FormFactor offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.
300 mm semi-/ fully-automated on-wafer power device characterization system
200 mm semi-/ fully-automated on-wafer power device characterization system
200 mm manual/ semi-automated on-wafer power device characterization system
150 mm manual on-wafer power device characterization system
Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
Integrated system with Keysight Photonics Application Suite hardware and software
Integrated system with Keysight PDA for power semiconductor device characterization
Integrated system with Keysight SPA for DC parametric measurements
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
Wafer/Multi-chip Cryogenic Systems
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated. Automatic chip alignment, OCR and wafer mark reading are exclusive features of our fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling. With a large install base of >80 stations worldwide, we bring expertise and technical know-how to provide the right solution for your measurement challenge.
Our vacuum and pressure probe stations for on-wafer measurements in a high vacuum or controlled pressure environment enable precise µ-bolometer test (un-cooled IR-FPA), MEMS characterization (inertial MEMS, resonators and RF MEMS, pressure sensors), IV/CV, RF/mmW and Opto measurements. Multiple optical instruments like IR radiation sources (black bodies), and up to eight probe positioners and/or a probe card can be integrated. The high stability design provides excellent contact quality and accurate measurement results in a condensation-free test environment. Step and repeat capability enables high throughput with our semi-automated systems.
Custom Probe Systems
Customized solutions for a variety of challenging applications
Certified Used Equipment
We offer several unique software solutions that enhance the functionality of your wafer-level test system