Genus
300 mm NAND Flash Probe Card Architecture
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300 mm NAND Flash Probe Card Architecture
Looking for customer support? Ready to learn more about our products and services?
Contact Sales TodayThe Genus probe card is FormFactor’s newest 300 mm full-wafer contact testing solution for NAND Flash applications. The product enables one touchdown capability for NAND Flash testing with high pin count capability addressing the industry’s drive to increase bit growth and complexity. The ability to increase pin counts results in improved power delivery for 3D NAND with additional power and ground pins. Using FormFactor’s proven 2D MEMS probes and space transformation technology, the Genus platform delivers optimum CTE matching for a wide temperature range, resulting in optimized probe placement and superior scrub performance. The Genus probe card offers dual temperature capability of -40°C to 130°C.