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The Genus probe card is FormFactor’s newest 300 mm full-wafer contact testing solution for NAND Flash applications. The product enables one touchdown capability for NAND Flash testing with high pin count capability addressing the industry’s drive to increase bit growth and complexity. The ability to increase pin counts results in improved power delivery for 3D NAND with additional power and ground pins. Using FormFactor’s proven 2D MEMS probes and space transformation technology, the Genus platform delivers optimum CTE matching for a wide temperature range, resulting in optimized probe placement and superior scrub performance. The Genus probe card offers dual temperature capability of -40°C to 130°C.

  • Increase throughput to test in excess of 35,000 probes
  • Test speeds of 125 MHz capable
  • Scalable 2D MEMS MicroSpring™ technology enables flexible pad layout with superior contact performance and long probe card lifetime
  • Excellent current carrying capacity
  • Fine pitch capability down to 70 μm
  • Capable to probe on 50 μm x 50 μm pads
  • Full wafer contactor architecture optimized for single- and dual-temperature designs
  • Excellent scrub mark position across wide temperature range
  • Superior thermal operation to shorten soak time and improve scrub performance