|Z| Probe® Power
High power, high performance probe
By using this site, you agree to our updated Privacy Policy and our Web Terms of Use
This website uses cookies to improve your experience while you navigate through the website. Out of these cookies, the cookies that are categorized as necessary are stored on your browser as they are essential for the working of basic functionalities of the website. We also use third-party cookies that help us analyze and understand how you use this website. These cookies will be stored in your browser only with your consent. You also have the option to opt-out of these cookies. But opting out of some of these cookies may have an effect on your browsing experience.
Essential cookies help the website function by enabling functionality and remembering user choices. The website will not function properly without them.
Name | Provider | Purpose | Expires |
---|---|---|---|
pint-checkbox-non-necessary | formfactor.com | Remembers your selected cookie consent preference | 1 Year |
pint-cookies-accepted | formfactor.com | Remembers that you have made a cookie preference | 1 Year |
Non-Essential cookies are those that help compile site statistics or are provided by third-party services, like ad networks, real-time support chat, or videos.
Name | Provider | Purpose | Expires |
---|---|---|---|
_ga | formfactor.com | The primary Google Analytics identifier for session and campaign data | 2 Year |
_gid | formfactor.com | A Google Analytics identifier | 1 Day |
_gat_UA-XXXXXXX-Y | formfactor.com | A Google Analytics identifier that uniquely associates this site to the caputured analytics (the ID, 'XXXXXXX-Y', may vary based on content, site, or language) | 1 Hour |
1P_JAR | google.com | Helps Google understand how the user used the website and any ads they interacted with | 1 Month |
High power, high performance probe
Looking for customer support? Ready to learn more about our products and services?
Contact Sales TodayThe demand for access to rich content anywhere in the world is driving the growth of wireless transmission of information. This increases the need for RF power devices in wireless systems and new technologies such as GaN and SiC. This in turn necessitates the characterization of these new technologies at wafer-level, which significantly reduces the time needed to develop new models. These models are used in new device designs, which are then further implemented in wireless transmission systems (base stations, satellites, etc.) to meet the demands of the content-hungry consumer.
To provide highly accurate characterization of RF power devices at wafer level, the |Z| Probe® Power, based off proven |Z| Probe technology, handles high power at high frequencies (up to 40 GHz). The |Z| Probe Power provides excellent contact repeatability and extremely low contact resistance to deliver accurate results in load-pull measurement setups, which are typical for characterizing RF power devices.
Since insertion loss must be kept low in load-pull and noise-parameter measurements to secure a high reflection coefficient (Γ), |Z| Probe Power has been designed to provide an extremely low insertion loss. This means you get more accurate measurements especially at non-50 Ω impedances.