S-Parameter and DC Parametric Measurements
Device characterization requires a suite of measurements in the DC and frequency domains, with flexibility and easily integrated tools which work together seamlessly.
Fully-integrated systems from FormFactor and Keysight Technologies eliminate uncertainty in building up lab capabilities, providing measurement instruments, wafer probers, probes, and software proven to cooperatively deliver data accuracy and correlation.
MeasureOne Benefits Include
- Best-of-breed, high-performance tools from industry leaders FormFactor and Keysight Technologies
- Configured and optimized to deliver accurate, repeatable, and automated on-wafer S-Parameter & DC Parametric measurements
Solution Components Include
- Cascade 200 mm or 300 mm semi-automated probe system, WinCal XE calibration software, Infinity Probes, and ISS calibration standards
- Keysight Technologies PNA or PNA-X, B1500A, WaferPro-XP, IC-CAP software, and DC Power Analyzer
- Now available as an mmW/THz Integrated Measurement System and a DC Integrated Measurement System – comprehensive, turn-key, all-in-one FormFactor + Keysight solutions at no additional cost!