Autonomous Wafer Probing featuring Contact Intelligence
Autonomous DC Overview
FormFactor introduces a new assistant for autonomous DC measurement of devices over multiple temperatures.
With FormFactor’s Contact Intelligence, the operator can start a test and leave the system measuring during the whole shift, overnight or even over the weekend, without any user intervention. Probes are dynamically corrected for the most accurate pad placement on-the-ﬂy to compensate for any thermal expansion of the probes or device when changing temperature. This results in testing more devices in a shorter period of time, with a higher degree of conﬁdence in the DC measurements, leading to more accurate data and faster time to market.
Autonomous DC Key Features
- Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
- Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
- Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.