Increased data consumption and the growing proliferation of memory device applications are driving the demand for DRAM and Flash memory. FormFactor production wafer probe cards offer cost-effective solutions for memory test.
In addition to smartphones and other portable devices, memory IC applications have expanded into data centers, solid state drives (SSDs), automobiles, appliances, and other electronics.
As the memory IC market continues to advance and expand, semiconductor manufacturers face the complex challenges of high parallelism, full-wafer contact testing. FormFactor’s range of high-performance wafer test solutions help chip suppliers achieve yield optimization, lower cost of test and faster time-to-market for today’s advanced memory devices.
DRAM - Full-wafer Contact Testing
Targeting 1-2 Touchdowns with 256-3200 Sites
The DRAM technology process nodes continue to shrink, driven by the demand to increase bit density and reduce memory device cost. With the recent accelerated transition to the 1Z and 1α nanometer process nodes, die count per wafer is increasing rapidly. As a result, full-wafer DRAM probe cards that simultaneously test every die on the wafer must keep pace with this increase. In addition, wafer sort throughput must advance to achieve the target cost without adding significant capital expenditure to the existing test floor.
Working with the world’s largest memory manufacturers, FormFactor is the leader in developing and qualifying next generation DRAM probe cards. FormFactor’s SmartMatrix 3000XP probe card solution incorporates custom electronics to enhance signal integrity while leveraging massive tester resource sharing to enable highly parallel test at the 1Z and 1α nanometer nodes. Specifically developed to support fast design ramps and advanced product roadmaps, this platform extends the production-proven Matrix™ architecture to provide test parallelism in excess of 3000 die per wafer on a single touchdown. Unique technology features enable FormFactor’s Matrix platform to support challenging test requirements.
FormFactor’s ATRE (Advanced Tester Resource Enhancement) is a collection of custom devices and corresponding infrastructure that enables high parallelism test by increasing native tester resources controlled by the test program through customized communication protocols.