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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
Optical
FormFactor’s family of optical device probe cards offer customized solutions for testing CMOS image sensors and LED devices. FormFactor’s Hikari probe card solution delivers excellent light uniformity, low power noise within the DUT and across the array, with minimal pad damage. These capabilities allow manufacturers to reduce test time and maximize yields.
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