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Cascade Probe Systems

Probe systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe card manufacturing company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Probe sales

              Quickly find a representative in your area to answer your sales and support questions.

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                Asset 4
                  Autonomous RF Measurement Assistant with Keysight Network Analyzer on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Keysight Network Analyzer on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Virginia Diodes Extender on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Virginia Diodes Extender on 300 mm Probe Station CM300xi
                  WinCal XE on-wafer RF measurement calibration software is fully integrated in Velox probe station control software
                  Products Probe Systems Autonomous Assistants Autonomous RF

                  Cascade

                  Autonomous RF

                  Autonomous RF Wafer Probing featuring Contact Intelligence

                  Autonomous RF Measurement Assistant with Keysight Network Analyzer on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Keysight Network Analyzer on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Virginia Diodes Extender on 200 mm Probe Station SUMMIT200
                  Autonomous RF Measurement Assistant with Virginia Diodes Extender on 300 mm Probe Station CM300xi
                  WinCal XE on-wafer RF measurement calibration software is fully integrated in Velox probe station control software
                  OverviewKey FeaturesDownloads

                  Autonomous RF Overview

                  Perform True Autonomous RF and mm-Wave Measurements and Calibrations on 200mm and 300mm Probe Stations

                  FormFactor introduces a new assistant for autonomous calibration and measurement of RF devices over multiple temperatures. New RF devices for applications such as 5G, autonomous driving and next generation Wi-Fi, need to have the most accurate device models for their IC designs. Normal testing of RF device modelling test structures requires large amounts of time from the engineer to perform re-calibrations whenever the system drifts beyond a usable limit. Re-positioning of the probes when changing temperature, also requires user intervention.

                  With FormFactor’s Contact Intelligence, the operator can start a test and leave the probe station measuring during the whole shift, overnight or even over the weekend, without any user intervention. Contact Intelligence offers true hands-free and autonomous RF calibrations and measurements over multiple temperatures. Programmable positioners and, probe tip recognition algorithms coordinate with our WinCal XE calibration software to automatically recalibrate if the system performance drifts beyond a usable limit. Probes are dynamically corrected for the most accurate pad placement on-the-fly to compensate for any thermal expansion of the probes or device when changing temperature. This results in testing more devices in a shorter period of time, with a higher degree of confidence in the RF measurement performance, leading to more accurate design models and faster time to market.

                  The Autonomous RF Measurement Assistant is available for the following 200 mm and 300 mm probe stations: CM300xi, SUMMIT200, Summit 12000 and Elite 300.

                  Autonomous RF Key Features

                  Autonomous RF Measurement Assistant with Keysight Network Analyzer on 200 mm Probe Station SUMMIT200

                  Contact Intelligence

                  • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
                  • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
                  • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
                  • Calibration Monitor and Re-calibration – System will
                    continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

                  Downloads

                  Autonomous RF Measurement Assistant Brochure
                  Autonomous RF Calibrations and Measurements Brief
                  Advanced mm-Wave and Terahertz Measurements with Cascade Probe Stations
                  Cascade Probe Systems Brochure

                  Related Products

                   

                  The SUMMIT200 advanced 200 mm probe station series support Contact Intelligence – an innovative technology that senses environmental changes and reacts to optimize probe contact accuracy for autonomous semiconductor test.  Learn More about SUMMIT200 Probe Stations
                  The CM300xi advanced 300 mm probe station series with Contact Intelligence meet the measurement challenges brought on by extremely complex environments, such as unattended testing on small pads over time and at multiple temperatures. Learn More about CM300xi Probe Stations

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                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • AUTONOMOUS ASSISTANTS
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Advanced Test
                        • Vacuum/Cryo/Pressure Systems
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Light Wave Probe
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • RF / MMW / RADAR
                        • Katana-RF
                        • Pyrana
                        • Pyramid Accel Test Fixture
                        • Pyramid-MW
                        • Pyramid RF P-Series
                        • Back
                      • CALIBRATION TOOLS
                        • Pyramid Calibration Substrate
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • High Bandwith Memory
                      • Silicon Photonics
                      • 5G Devices
                      • DC Parametric Test
                      • Power Semiconductors
                      • Cryogenic Devices
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Back
                    • MeasureOne Solutions
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • S-Parameter & DC Parametric
                      • Terahertz Probing
                      • Back
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                      • Accelerating Profitability
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