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Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

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    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

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      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

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        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

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            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

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              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

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                    • ACP
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                    • INFINITY
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                    • |Z| PROBE
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                    • T-WAVE
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                    • RF MULTICONTACT
                      • InfinityQuad
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                      • QuadCard™
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Optical Probes
                      • Cryogenic Probes
                    • SIGNAL INTEGRITY
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                  Home

                  HPD is now part of FormFactor

                  HPD is now part of FormFactor

                  HPD is now part of FormFactor

                  The leader in precision cryogenics joins FormFactor to deliver next-generation test and measurement products for quantum computing, superconducting logic, and other cryogenic applications.

                  The leader in precision cryogenics joins FormFactor to deliver next-generation test and measurement products for quantum computing, superconducting logic, and other cryogenic applications.

                  LEARN MORE

                  New CM300xi-ULN
                  for Ultra Low Noise Measurements

                  New CM300xi-ULN
                  for Ultra Low Noise Measurements

                  Verified, 4x Faster, Accurate Measurements –
                  Without the Noise

                  Verified, 4x Faster, Accurate Measurements –
                  Without the Noise

                  Learn More
                  Silicon Photonics Probing

                  New Features for
                  Silicon Photonics
                  Probing

                  New Features for
                  Silicon Photonics
                  Probing

                  • Die-level and wafer-level edge coupling
                  • In-situ calibrations at multiple temperatures

                  Die-level and wafer-level edge coupling
                  In-situ calibrations at multiple temperatures

                  Learn More
                  150mm Probe Systems


                  150 mm Probe Stations starting at $13,880

                  150 mm Probe Stations starting at $13,880

                  Customize your individual 150 mm probe station with our new modular concept”

                  Customize your individual 150 mm probe station with our new modular concept”

                  Learn More
                  Semiconductor Wafer Test


                  Optimize Performance &
                  Accelerate Profitability


                  Optimize Performance &
                  Accelerate Profitability

                  Let us help you navigate the technology transitions that are
                  essential to next-generation applications.

                  Let us help you navigate the
                  technology transitions that
                  are essential to next-
                  generation applications.

                  Learn How
                  New 3D Manual Controls for CM300xi


                  New 3D Manual Controls for CM300xi

                  New 3D Manual Controls for CM300xi

                  Extremely intuitive, rapid and precise manual control of the stage in X, Y and Z direction

                  Extremely intuitive, rapid and precise manual control of the stage in X, Y and Z direction

                  Wafer-level Characterization of 5G Devices


                  Wafer-level Characterization of 5G Devices and Circuits

                  Wafer-level Characterization of 5G Devices and Circuits

                  New Integrated, Automated Probe Solution

                  New Integrated, Automated Probe Solution

                  Learn More
                  Contact Intelligence


                  Contact Intelligence

                  Contact Intelligence

                  Accurate, autonomous measurement for high productivity in RF, DC and SiPh testing.

                  Autonomous measurements for RF, DC and SiPh.

                  Learn More

                  Amazing MEMS –

                  Innovative Technology Enables Advanced Wafer Test

                  The genius of MEMS (Micro-Electro-Mechanical Systems) is the heart of advanced probe cards, accounting for ~75% of the world’s advanced probe card market.  MEMS technology provides a way to manufacture the probes, which contact the I/Os and power connections on ICs, at micron-level perfection.  The precision of MEMS probes makes it ideal to support fine-pitch and high-pin count requirements of the leading-edge semiconductor process nodes and advanced packaging.  But not all MEMS probes are created equal.  Find out how FormFactor composite-metal MEMS technology is enabling a range of new ICs at the cutting edge of electronics innovations.

                  Learn More
                  https://vimeo.com/457909852?loop=0

                  News & Updates

                  PRESS RELEASE

                  New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

                  SmartMatrix 3000XP provides 300 mm wafer testing for up to 3000 die simultaneously

                  Read More
                  VLSI Award - THE BEST Supplier

                  PRESS RELEASE

                  2020 THE BEST Suppliers Award

                  Customers Rate FormFactor One of THE BEST Suppliers in the Semiconductor Industry.

                  Read More
                  CEO Mike Slessor - NYC Summit 2018

                  NEWS ARTICLE

                  An Inside Look At Testing’s Leading Edge

                  FormFactor’s CEO Mike Slessor discusses AI, 5G and HBM test issues with Semiconductor Engineering.

                  Read More
                  VLSI Top Supplier Probe Cards

                  PRESS RELEASE

                  FormFactor Rated as Top Supplier of Semiconductor Probe Cards

                  Company Expands Leading Market Share, with Gains in High-growth Segments of the Probe Card Market

                  Read More
                  Integrated Silicon Photonics Wafer Probing Solution - Single Fibers

                  PRESS RELEASE

                  FormFactor Introduces Edge Coupling Probe Solution for Silicon Photonics Devices

                  New Solution Features Die and Wafer-level Testing, In-situ Calibration and Integrated Test Automation Software from Keysight Technologies

                  Read More
                  Semiconductor Chiplet

                  NEWS ARTICLE

                  Chiplet Momentum Rising

                  FormFactor’s CMO Amy Leong discusses discusses the need for "good enough die" at a reasonable test cost.

                  Read More
                  Altius Probe Card

                  PRESS RELEASE

                  FormFactor Introduces the Altius™ Vertical MEMS Probe Card for Advanced Packaging Technologies

                  Supports at-speed test of high bandwidth memory and verification of high-density interposers

                  Read More
                  FRT - A FormFactor company

                  PRESS RELEASE

                  FRT is now a FormFactor company

                  Expands test and measurement leadership in high-growth Advanced Packaging and MEMS applications

                  Read More
                  HBM-DRAM

                  NEWS ARTICLE

                  Advanced Packaging, Heterogeneous Integration and Test

                  CEO Mike Slessor explains the groundswell of die-integration technologies that are revolutionizing packaging, assembly and test.

                  Read More
                  Automated Wafer-level Probing

                  NEWS ARTICLE

                  Silicon Photonics: Automated wafer-level probing meets silicon photonics

                  FormFactor’s automated wafer probing systems enable Silicon Photonic chip designers to characterize and qualify their designs faster than ever.

                  Read More
                  Our European Service Center

                  PRESS RELEASE

                  FormFactor Adds Second European Service Center

                  New service center opens in the key semiconductor manufacturing region of Grenoble, France.

                  Read More
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                  • Products
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                        • MPS150
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                        • Back
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                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
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                      • (Dedicated Systems)
                      • AUTONOMOUS ASSISTANTS
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Board Level Systems
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                      • Power Systems
                        • Tesla
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                      • Advanced Test
                        • Vacuum/Cryo/Pressure Systems
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                        • WinCal XE
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                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
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                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • RF / MMW / RADAR
                        • Katana-RF
                        • Pyrana
                        • Pyramid Accel Test Fixture
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                      • VCSEL and MicroLED
                      • Back
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