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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, 200 mm manual and automated wafer probe stations have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
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IMS-K-mmW/THz
Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
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IMS-K-Load-Pull
Integrated Measurement System with Keysight VNAs and Focus Microwaves tuners for On-Wafer Load-Pull Measurements
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IMS-K-LFN
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
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IMS-K-DC
Integrated system with Keysight SPA for DC parametric measurements
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IMS-K-Power
Integrated system with Keysight PDA for power semiconductor device characterization
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IMS-K-SiPh
Integrated system with Keysight Photonics Application Suite hardware and software
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