Pharos™ Probe Series
Low-loss optical probing for edge and surface coupling
Low-loss optical probing for edge and surface coupling
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The Pharos™ Optical Probe Series is a next-generation family ofoptical probes designed for silicon photonics testing in high-volume manufacturing environments. Pharos optical probes provide low-loss optical coupling for both edge-coupling and surface-coupling applications. Each Pharos optical probe consists of a fiber array unit (FAU) with micro-optics tailored to ideally match the customer’s device under test (DUT).
Designed for applications in AI, data centers, wearables, and other silicon photonics markets, Pharos optical probes provide accurate and reliable testing of optical transceivers, sensors, co-packaged optics (CPO), and other photonic devices.
Paired with FormFactor’s Autonomous Silicon Photonics Assistant, the Pharos Optical Probes enable automated calibration and alignment and allow users of all experience levels to perform complex optical test measurements with ease.
Pharos optical probes are compatible with FormFactor’s TRITON™, CM300xi-SiPh, and SUMMIT200 probe stations, delivering consistent, low-loss coupling and faster time-to-insight for your silicon photonics testing needs.
TRITON™ | Production‑Ready Silicon Photonics Test Cell for High‑Volume Manufacturing
TRITON™ is the industry’s first production‑ready silicon photonics test cell, purpose‑built for high‑volume manufacturing.
Developed by FormFactor, Advantest, and Tokyo Electron (TEL), TRITON delivers fully automated, wafer‑level optical and electrical co‑measurement with nine‑axis nano‑precision, low‑loss edge and surface coupling, and factory‑ready automation—designed for AI, co‑packaged optics, and data‑center production.
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