• Skip to primary navigation
  • Skip to main content

Cascade Probe Systems

Cascade Probe Systems

We offer a complete line of premium performance analytical probe stations for on-wafer probing and board test that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.

See All Probe Systems

    Cascade Probes

    Wafer Test Probes

    We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.

    See All Probe Products

      Probe Cards

      Probe Cards

      We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.

      See All Probe Cards

        Metrology

        Metrology Systems - FRT Tools

        FRT - a FormFactor company - manufactures powerful surface metrology tools for various sectors such as development production and quality control. Due to the design and construction of these multi-sensor devices, FRT tools can be used for multiple applications.

        Learn More @ FRT

          Test Expertise

          Test Expertise

          FormFactor supports customers throughout the entire design-to-production continuum, from characterization, modeling, reliability, and design de-bug, to qualification and production test.

          Learn More

            Ready to learn more about our products and services?

            Contact Sales

            Company

            Probe Card Manufacturing Company

            Our customers rely on our proven portfolio of products and our experienced engineers to help them meet today’s test and measurement challenges.

            Learn More

              Ready to learn more about our products and services?

              Contact Sales

              Sales & Service

              Probe Sales & Service

              Quickly find a representative in your area to answer your sales and support questions.

              Learn More

                Ready to learn more about our products and services?

                Contact Sales

                • Products
                  • Probe Systems
                    • (Modular Systems)
                    • 150 MM Probe Systems
                      • MPS150
                      • Genius Education Kits
                    • 200 MM Probe Systems
                      • Summit
                      • BlueRay
                      • PM8/EPS200
                      • See All…
                    • 300 MM Probe Systems
                      • CM300
                      • PM300
                      • See All…
                    • (Dedicated Systems)
                    • AUTONOMOUS ASSISTANTS
                      • Autonomous DC
                      • Autonomous RF
                      • Autonomous SiPh
                    • Board Level Systems
                      • Board Test Systems
                    • Power Systems
                      • Tesla
                    • Advanced Test
                      • Vacuum/Cryo/Pressure Systems
                    • Software
                      • Velox
                      • WinCal XE
                    • Accessories
                      • eVue Microscope
                      • Positioners
                      • Chucks
                      • Vibration Isolation Tables
                      • ShieldEnclosure™
                        •  
                          •  
                      •  
                        •  
                        •  
                    • Additional Products/Programs
                      • Custom Probe Systems
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Educational Savings
                    •  
                    •  
                  • Probes
                    • ACP
                      • ACP Probe – Coaxial
                      • ACP Probe – Cryo/Vacuum
                    • INFINITY
                      • Infinity Probe – Coaxial
                      • InfinityXT™ Probe – Coaxial
                      • Infinity Waveguide Probe
                    • |Z| PROBE
                      • |Z| Probe – Coaxial
                      • |Z| Probe® PCB
                      • |Z| Probe® Power
                    • T-WAVE
                      • T-Wave Probe
                    • RF MULTICONTACT
                      • InfinityQuad
                      • ACP-Q Probe
                      • Unity Probe
                      • Multi-|Z| Probe
                      • |Z| ProbeWedge
                      • QuadCard™
                    • DC PARAMETRIC
                      • DCP 100 Series Probe
                      • DCP-HTR Series Probe
                    • DC MULTICONTACT
                      • DC-Q Probe
                      • Eye-Pass Probe
                      • WPH Probe
                    • DC POWER
                      • High Current Probe
                      • High Voltage Probe
                      • Ultra High-Power (UHP)
                    • SPECIALTY
                      • Resistive Matching and Termination
                      • Optical Probes
                      • Cryogenic Probes
                    • SIGNAL INTEGRITY
                      • FPC Probe
                    • CALIBRATION TOOLS
                      • Impedance Standard Substrates
                      • CSR Cal Substrates
                      • Multiline TRL Cal Substrates
                      • WinCal XE
                    • Product Support
                      • Probe Support
                      • Probe Repair
                      • WinCal Support
                  • Probe Cards
                    • DRAM
                      • PH Series
                      • SmartMatrix
                    • FLASH
                      • TouchMatrix
                    • FOUNDRY & LOGIC
                      • Altius
                      • Katana
                      • QiLin
                      • Cantilever
                      • Apollo
                      • TrueScale
                      • Vx-MP
                    • PARAMETRIC
                      • Pyramid Parametric
                      • Takumi
                    • RF / MMW / RADAR
                      • Katana-RF
                      • Pyrana
                      • Pyramid Accel Test Fixture
                      • Pyramid-MW
                      • Pyramid RF P-Series
                    • CALIBRATION TOOLS
                      • Pyramid Calibration Substrate
                  • Metrology
                    • Metrology Systems
                      • MicroProf® AP
                      • MicroProf® FS
                      • MicroProf® FE
                      • MicroProf® MHU
                      • MicroProf® TL
                      • MicroProf® 300
                      • MicroProf® 200
                      • MicroProf® 100
                • Test Expertise
                  • Customer Collaboration
                    • Sharing Expertise
                    • Lab to Fab
                  • Applications
                    • 5G Devices
                    • Advanced Packaging
                    • Cryogenic Devices
                    • DC Parametric Test
                    • Low Frequency Noise
                    • mm-Wave Load-Pull
                    • Power Semiconductors
                    • Silicon Photonics
                    • VCSEL and MicroLED
                  • Technologies
                    • Contact Intelligence
                    • MEMS
                  • Publications
                    • Technical Papers
                    • Case Studies
                    • Test Insights Presentations
                  • MEASUREONE LEADERSHIP ALLIANCES
                    • MeasureOne Program Overview
                    • 1/f Device Characterization
                    • Circuit Characterization
                    • Cryogenic / Magnetic Probing
                    • Power Semiconductor Probing
                    • RF Tuning & Load-Pull
                    • S-Parameter & DC Parametric
                    • Silicon Photonics Test
                    • Terahertz Probing
                • Company
                  • About Us
                    • Accelerating Profitability
                    • Company Profile
                    • Our History
                    • Leadership
                    • Board of Directors
                    • Corporate Citizenship
                    • Global Locations
                  • Investors
                    • Investor Relations
                  • News & Events
                    • Newsroom
                    • Upcoming Events
                    • Blog
                  • Careers
                    • Career Opportunities
                    • Recruitment Privacy Policy
                  • Related Websites
                    • FRTmetrology.com
                    • High Precision Devices (HPD)
                • Sales & Service
                  • Contact Us
                    • Global Locations
                    • Contact Sales
                    • Parts & Service Request
                  • Additional Products/Programs
                    • Equipment Financing
                    • Educational Savings
                    • Certified Used Equipment
                    • Trade-in/Buy Back
                    • Logistics Service
                  • Product Support
                    • FormFactor RMA
                    • Cascade RMA
                    • Probe Systems Support
                    • Analytical Probe Support
                    • Analytical Probe Repair
                    • Pyramid Probe Card Support
                    • WinCal XE Support
                    • Documentation & Downloads
                  • Portal Sign In
                    • Sales Portal
                    • Service Portal
                Asset 4
                  Company Legal Information Web Terms of Use

                  Web Terms of Use

                  By accessing or using the FormFactor web site, you agree to all of the terms and conditions below. If you do not agree with the following terms, do not use this site. You acknowledge that these terms may be updated by FormFactor from time to time, and all such updates will apply to your use of this site. Please continue to review these terms when accessing this site.

                  1. Intellectual Property Rights. All material contained on this site, including but not limited to text, content, photographs, video, audio and graphics is owned by FormFactor and is protected by copyrights, trademarks, service marks and other proprietary rights and laws. It may be viewed, downloaded or otherwise copied or reproduced for personal use only. No modification or other use, whether commercial or otherwise, is allowed without the express written permission of FormFactor. Certain documents or products available on our site may be subject to separate terms and conditions regarding their use. You agree to abide by all such terms if you use these documents or products.

                  2. Links.  This site may refer you by link to the web sites of third parties. Links to other web sites posted on this site do not constitute an endorsement of such sites by FormFactor. FormFactor does not assume responsibility for the conduct of, or any content, products or other materials located on such sites. Your use of such sites is at your own risk. It is your responsibility to comply with any and all terms and conditions or other restrictions of such sites prior to use.

                  3. Privacy Policy. By using this site, you acknowledge that you have read and consent to the terms of the FormFactor Privacy Policy.

                  4. Information Only. Any information that may be provided on this site is general information only. It is not intended to be taken as advice with respect to any individual situation and cannot be relied upon as such. No assertion, representation or advice given by FormFactor on or by way of this site shall be binding on FormFactor.

                  5. Use of Submissions. Any questions, comments, data, materials or the like sent to FormFactor shall be deemed to be non-confidential. FormFactor shall have no obligation of any kind with respect to such information or material and therefore shall be free to reproduce, use, disclose, exhibit, display, transform, create derivative works and distribute the same to others without limitation. Further, FormFactor shall be free to use any ideas, concepts, know-how or techniques contained in such information or materials for any purpose whatsoever.

                  6. Errors. The information on this website may include substantial or insubstantial inaccuracies and errors. FormFactor reserves the right to revise or withdraw access to the information, documents, products and/or programs on this website at any time without notice. However, FormFactor makes no commitment to update the information.

                  7. Disclaimer of Warranty. All information provided on this web site is provided as a service by FormFactor. It is provided “as is, with all faults,” and FormFactor expressly disclaims all warranties of any kind, whether express, implied or otherwise, regarding the completeness, accuracy, non-infringement, merchantability or fitness for any particular purpose of any content or information provided on or through this site.

                  8. Limitation of Liability. Persons accessing the information on this site assume full responsibility for the use of the information and understand and agree that FormFactor is not responsible or liable for any claim, loss or damage arising from the use of the information. FormFactor will not be liable for any direct, indirect, incidental, special, consequential or exemplary damages, including but not limited to damages for loss of profits, goodwill, use, data or other intangible losses (even if it has been advised of the possibility of such damages), resulting from or related to the site or its content. Some jurisdictions do not allow the waiver of such damages, so this may not apply to you, but the waiver will apply to the furthest extent allowed by law.

                  9. Governing Law. Use of this site is governed by the laws of the State of California, excluding its choice of law principles. All claims relating to the use of this site shall be heard in the state and federal courts located in Alameda County.

                  • Company
                  • Company Profile
                  • Investor Relations
                  • Newsroom
                  • Our History
                  • Leadership
                  • Board of Directors
                  • Corporate Citizenship
                  • Blog
                  • Careers
                  • Career Opportunities
                  • Recruitment Privacy Policy
                  • Sales & Service
                  • Global Locations
                  • Products
                  • Probe Systems
                  • Probes
                  • Probe Cards

                  Social Media

                  LinkedIn Facebook YouTube
                  • Privacy Policy
                  • Web Terms of Use

                  ©2021, FormFactor. All Rights Reserved.

                  • Products
                    • Probe Systems
                      • (Modular Systems)
                      • 150 MM Probe Systems
                        • MPS150
                        • Genius Education Kits
                        • Back
                      • 200 MM Probe Systems
                        • Summit
                        • BlueRay
                        • PM8/EPS200
                        • See All…
                        • Back
                      • 300 MM Probe Systems
                        • CM300
                        • PM300
                        • See All…
                        • Back
                      • (Dedicated Systems)
                      • AUTONOMOUS ASSISTANTS
                        • Autonomous DC
                        • Autonomous RF
                        • Autonomous SiPh
                        • Back
                      • Board Level Systems
                        • Board Test Systems
                        • Back
                      • Power Systems
                        • Tesla
                        • Back
                      • Advanced Test
                        • Vacuum/Cryo/Pressure Systems
                        • Back
                      • Software
                        • Velox
                        • WinCal XE
                        • Back
                      • Accessories
                        • eVue Microscope
                        • Positioners
                        • Chucks
                        • Vibration Isolation Tables
                        • ShieldEnclosure™
                          •  
                            •  
                            • Back
                          • Back
                        •  
                          •  
                          •  
                          • Back
                        • Back
                      • Additional Products/Programs
                        • Custom Probe Systems
                        • Certified Used Equipment
                        • Trade-in/Buy Back
                        • Educational Savings
                        • Back
                      •  
                      •  
                      • Back
                    • Probes
                      • ACP
                        • ACP Probe – Coaxial
                        • ACP Probe – Cryo/Vacuum
                        • Back
                      • INFINITY
                        • Infinity Probe – Coaxial
                        • InfinityXT™ Probe – Coaxial
                        • Infinity Waveguide Probe
                        • Back
                      • |Z| PROBE
                        • |Z| Probe – Coaxial
                        • |Z| Probe® PCB
                        • |Z| Probe® Power
                        • Back
                      • T-WAVE
                        • T-Wave Probe
                        • Back
                      • RF MULTICONTACT
                        • InfinityQuad
                        • ACP-Q Probe
                        • Unity Probe
                        • Multi-|Z| Probe
                        • |Z| ProbeWedge
                        • QuadCard™
                        • Back
                      • DC PARAMETRIC
                        • DCP 100 Series Probe
                        • DCP-HTR Series Probe
                        • Back
                      • DC MULTICONTACT
                        • DC-Q Probe
                        • Eye-Pass Probe
                        • WPH Probe
                        • Back
                      • DC POWER
                        • High Current Probe
                        • High Voltage Probe
                        • Ultra High-Power (UHP)
                        • Back
                      • SPECIALTY
                        • Resistive Matching and Termination
                        • Optical Probes
                        • Cryogenic Probes
                        • Back
                      • SIGNAL INTEGRITY
                        • FPC Probe
                        • Back
                      • CALIBRATION TOOLS
                        • Impedance Standard Substrates
                        • CSR Cal Substrates
                        • Multiline TRL Cal Substrates
                        • WinCal XE
                        • Back
                      • Product Support
                        • Probe Support
                        • Probe Repair
                        • WinCal Support
                        • Back
                      • Back
                    • Probe Cards
                      • DRAM
                        • PH Series
                        • SmartMatrix
                        • Back
                      • FLASH
                        • TouchMatrix
                        • Back
                      • FOUNDRY & LOGIC
                        • Altius
                        • Katana
                        • QiLin
                        • Cantilever
                        • Apollo
                        • TrueScale
                        • Vx-MP
                        • Back
                      • PARAMETRIC
                        • Pyramid Parametric
                        • Takumi
                        • Back
                      • RF / MMW / RADAR
                        • Katana-RF
                        • Pyrana
                        • Pyramid Accel Test Fixture
                        • Pyramid-MW
                        • Pyramid RF P-Series
                        • Back
                      • CALIBRATION TOOLS
                        • Pyramid Calibration Substrate
                        • Back
                      • Back
                    • Metrology
                      • Metrology Systems
                        • MicroProf® AP
                        • MicroProf® FS
                        • MicroProf® FE
                        • MicroProf® MHU
                        • MicroProf® TL
                        • MicroProf® 300
                        • MicroProf® 200
                        • MicroProf® 100
                        • Back
                      • Back
                    • Back
                  • Test Expertise
                    • Customer Collaboration
                      • Sharing Expertise
                      • Lab to Fab
                      • Back
                    • Applications
                      • 5G Devices
                      • Advanced Packaging
                      • Cryogenic Devices
                      • DC Parametric Test
                      • Low Frequency Noise
                      • mm-Wave Load-Pull
                      • Power Semiconductors
                      • Silicon Photonics
                      • VCSEL and MicroLED
                      • Back
                    • Technologies
                      • Contact Intelligence
                      • MEMS
                      • Back
                    • Publications
                      • Technical Papers
                      • Case Studies
                      • Test Insights Presentations
                      • Back
                    • MEASUREONE LEADERSHIP ALLIANCES
                      • MeasureOne Program Overview
                      • 1/f Device Characterization
                      • Circuit Characterization
                      • Cryogenic / Magnetic Probing
                      • Power Semiconductor Probing
                      • RF Tuning & Load-Pull
                      • S-Parameter & DC Parametric
                      • Silicon Photonics Test
                      • Terahertz Probing
                      • Back
                    • Back
                  • Company
                    • About Us
                      • Accelerating Profitability
                      • Company Profile
                      • Our History
                      • Leadership
                      • Board of Directors
                      • Corporate Citizenship
                      • Global Locations
                      • Back
                    • Investors
                      • Investor Relations
                      • Back
                    • News & Events
                      • Newsroom
                      • Upcoming Events
                      • Blog
                      • Back
                    • Careers
                      • Career Opportunities
                      • Recruitment Privacy Policy
                      • Back
                    • Related Websites
                      • FRTmetrology.com
                      • High Precision Devices (HPD)
                      • Back
                    • Back
                  • Sales & Service
                    • Contact Us
                      • Global Locations
                      • Contact Sales
                      • Parts & Service Request
                      • Back
                    • Additional Products/Programs
                      • Equipment Financing
                      • Educational Savings
                      • Certified Used Equipment
                      • Trade-in/Buy Back
                      • Logistics Service
                      • Back
                    • Product Support
                      • FormFactor RMA
                      • Cascade RMA
                      • Probe Systems Support
                      • Analytical Probe Support
                      • Analytical Probe Repair
                      • Pyramid Probe Card Support
                      • WinCal XE Support
                      • Documentation & Downloads
                      • Back
                    • Portal Sign In
                      • Sales Portal
                      • Service Portal
                      • Back
                    • Back

                  [ Placeholder content for popup link ] WordPress Download Manager - Best Download Management Plugin

                  IMPORTANT NOTIFICATIONS TO FORMFACTOR EMPLOYEES REGARDING COVID-19

                  • English
                  • Japanese
                  • Chinese Simplified

                  We've updated our Privacy Policy.

                  Our policy describes the use of cookies and similar technologies on this website. It also describes how we use any personal data we collect. Click “Agree” (below) to consent to this use. To learn more, please read the FormFactor Privacy Policy.