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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from inspection and metrology, characterization, modeling, reliability, and design de-bug, to qualification and production test.
200 mm Systems
Whatever the application - device characterization, modeling, process development, design de-bug or IC failure analysis, 200 mm manual and automated wafer probe stations have the precision and versatility needed for the most advanced semiconductor processes and aggressively scaled devices.
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