When Precise Contact Matters
Innovative probe system technology senses and reacts to enable autonomous semiconductor test.
FormFactor has developed an integrated suite of tools for the engineering lab to optimize probe contact accuracy on wafers to deliver precise measurements enabling true, autonomous test. From sensitive temperature testing environments in RF or DC applications, all the way to silicon photonics where precise placement of light in test situations is critical, Contact Intelligence accelerates time to accurate data, in some cases, reducing test time from months to minutes.
FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide array of applications in device testing.