We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership. Our probe systems are available with a complete set of accessories such as microscopes, thermal control systems, software and industry-leading probes.
We offer more than 50 analytical probe models for wafer, package, and board level characterization. Our families of RF, mixed-signal and DC probes are designed to meet the challenges of a wide range of probing environments.
We offer an extensive portfolio of high-performance probe cards for memory, RF, foundry and logic devices that help lower overall production costs, improve yields and enable “more-than-Moore” advanced packaging technologies.
FRT Metrology manufactures powerful surface metrology tools for production, development, and quality control. Due to the design and construction of these multi-sensor devices, FRT Metrology tools can be used for multiple wafer and non-wafer applications.