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FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from inspection and metrology, characterization, modeling, reliability, and design de-bug, to qualification and production test.
300 mm Systems
Cascade 300 mm probe stations set the standard for manual and automated on-wafer test, delivering the precision and versatility needed to address a wide range of advanced, complex testing requirements.
FormFactor’s Contact Intelligence technology combines smart hardware design and innovative software algorithms to provide accurate probe-to-pad alignment and electronic recalibrations in engineering labs and many production applications. FormFactor now has specialized Contact Intelligence assistants for autonomous RF, DC and Silicon Photonics (SiPh) testing.
The broad use of power semiconductors has created a pressing need to characterize power devices quickly and efficiently. FormFactor offers on-wafer power device characterization systems to reduce time-to-market for new power devices and to keep up with production.