Benefits of Full Wafer Contact Architecture lowers test costs for leading edge Automotive and Embedded Memory Applications

LIVERMORE, Calif. – June 6th, 2012 – FormFactor, Inc. (Nasdaq: FORM) today announced general availability of TrueScale MatrixTM probe cards for 200mm and 300mm Full Wafer Contact system-on-chip, or SOC, test applications. TrueScale Matrix applies the company’s proven, high-parallel capabilities of SmartMatrixTM and TouchMatrixTM memory product solutions to SOC test.

The Matrix architecture provides consistent contact performance across the full wafer, over the life of the probe card to help IC makers lower their overall test costs. The TrueScale Matrix solution enables manufacturers of embedded memory and automotive applications to reduce the number of touchdowns per wafer, while achieving stable test over a wide temperature range. New high-parallel SOC test systems can leverage the TrueScale Matrix architecture for DUT array optimization to achieve 256 DUTs in parallel capability today, with extendibility to 512 DUTs or higher.

“Rapidly increasing customer adoption of our TrueScale Matrix solution for SOC applications reinforces the benefits of stable contact, high parallelism, and improved yield demonstrated by the Matrix platform for DRAM and FLASH,” said Glenn Farris, vice president of Marketing at FormFactor. “We are investing in our Matrix architecture in close partnership with our customers to enable long term wafer test roadmaps.”

The TrueScale Matrix platform leverages the company’s MicroSpring® 3D MEMS contact technology to deliver probing performance which increases wafer test cell utilization and parallelism while improving test yields, enabling customers to lower test costs on SOC, DRAM, and FLASH devices. The most recent TrueScale Matrix product shipment was made to a leading automotive device supplier for highly parallel microcontroller test. FormFactor’s customers have installed over 1200 units of the Matrix probe solutions, making this the fastest ramping platform in company history.