RMA - Post Shipment Survey | FormFactor, Inc.

Products Applications Industries Sales & Service Company

Overview Probe Systems Probes Probe Cards Quantum Cryogenics Overview Semiconductor R&D High Volume Manufacturing Partner Solutions Publications & Resources Overview Industries Overview Overview Contact Us Product Support Additional Programs Test/Measurement Services Company Information Careers Investors News, Events and Media Customer Collaboration

Modular Systems 150 mm Systems 200 mm Systems 300 mm Systems Dedicated Systems Autonomous Assistants High Volume Manufacturing Power Systems Vacuum/Pressure Systems Cryogenic Systems Integrated Systems With Keysight Additional Products Software Accessories Products/Programs View All Probe Systems Single/Dual Channel RF Single/Dual Broadband Coaxial Banded Waveguide Cryo/Vacuum/Hi-Temp Signal Integrity Specialty Mixed Signal RF and DC RF Multicontact DC Multicontact High Performance DC DC Parametric DC Power Optical Probes Pharos™ Probe Series Lightwave Probe (Single Fiber)VNA Calibration Tools Substrates Software Support Product Support View All Probe Products DRAM Flash Foundry & Logic Parametric Optical RF View All Probe Cards Probe Systems Wafer/Multi-chip Systems Chip-scale Systems Cryostats Dilution Refrigerators Additional Products Cryogenic Test Service View All Cryogenic Products DC Parametric Test Low Frequency Noise Power Semiconductors RF/mmW and 5G Terahertz mm-Wave Load-Pull Silicon Photonics VCSELs and MicroLEDs Quantum Computing Cryogenic Devices View All R&D Applications Foundry and Logic DRAM and Flash Memory Advanced Packaging RF/mmW and 5G AI Processors Optical Wafer Test Parametric Test Cryogenic Devices View All HVM Applications MeasureOne MeasureOne Program Overview 1/f Device Characterization Circuit Characterization Cryogenic / Magnetic Probing Power Semiconductor Probing RF Tuning & Load-Pull S-Parameter & DC Parametric Silicon Photonics Test Terahertz Probing Technical Papers Case Studies Test Insights Presentations Documentation and Downloads Computing, Data Centers, and Quantum 5G and 6G Communications Automotive Aerospace and Defense Global Locations Sales Representatives Contact Sales Parts & Service Request FormFactor RMA Cascade RMA Probe Systems Support Analytical Probe Support Analytical Probe Repair Pyramid Probe Card Support WinCal Support Documentation & Downloads Equipment Financing Educational Savings Logistics Service Cryogenic Test Company Profile Our History Leadership Board of Directors Corporate Citizenship Security & Compliance Working @ FormFactor United States Germany See All Job Openings Recruitment Privacy Policy Investor Relations Webinars Blog Podcasts Press Releases COMPASS Users Conference Lab to Fab Accelerating Profitability Sharing Expertise

MPS150 MPS150-SiPh Summit PM8/EPS200 See All...Autonomous DC Autonomous RF Autonomous SiPh Autonomous High-Power TRITON™Tesla IMS-K-mmW/THz IMS-K-Load-Pull IMS-K-LFN IMS-K-DC IMS-K-Power IMS-K-SiPh See All...Velox Velox Dash™WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Educational Savings Infinity Probe (145 GHz)InfinityXF Probe (250 GHz)InfinityXT Probe (110 GHz)|Z| Probe (67 GHz)|Z| Probe® Power T-Wave Probe (140 GHz-1.1 THz)ACP Probe (110 GHz)Infinity Waveguide (50-500 GHz)T-Wave Probe (140 GHz-1.1 THz)|Z| Probe - Coaxial (67 GHz)ACP Probe (110 GHz)Multi-|Z| Probe (20 GHz)FPC Probe (40-GHz)|Z| Probe® PCB (20 GHz)Resistive Matching and Termination InfinityQuad Probe (110) GHz)ACP-Q Probe (110 GHz)Unity Probe (20 GHz)Multi-|Z| Probe (20 GHz)QuadCard™ (Probe Dependent)DC-Q Probe InfinityQuad Eye-Pass Probe WPH Probe Multi-|Z| Probe DCP-X Probe DCP-HTR Series Probe DCP 100 Series Probe High Current Probe High Voltage Probe Ultra High-Power (UHP)Impedance Standard Substrates CSR Cal Substrates Multiline TRL Cal Substrates WinCal Velox Velox Dash™Probe Support Probe Repair Wincal Support PH Series SmartMatrix HFTAP Series TouchMatrix Altius Kepler™Apollo TrueScale Takumi Hikari Pyramid RF IQ3000 IQ2000 Base Flatiron™

Enabling Technologies

We offer a complete line of premium performance analytical probe stations for on-wafer probing that help increase process performance while reducing cost of ownership.

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Enabling Technology

FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test.

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Enabling Technology

MEMS probes are the integral elements of our advanced wafer probe cards. FormFactor uses MEMS to build millions of tiny robust electrical springs capable of testing ICs over more than a million contact cycles.

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Next-Gen Probing

The new InfinityXF™ sets a new benchmark in coaxial wafer probing, delivering true DC–250 GHz broadband performance and fast, repeatable S-parameter measurements enabling streamlined, high-frequency test.

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Enabling Technology

FormFactor's FRT Metrology products are now part of Camtek’s wide range of Inspection and Metrology solutions for the Semiconductor industry.

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Enabling Technology

FormFactor offers a range of cryogenic test and measurement solutions to quantum engineers. From chip-scale to wafer probing systems, cryostats and magnetometry systems to contract test services, our solutions meet the most challenging requirements.

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Applications

From the engineering lab to the production test floor, FormFactor’s products enable a wide range of test and measurement applications.

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Industries

FormFactor products ensure the quality and reliability of ICs used in electronics affecting every aspect of our lives. Follow the link below for a snapshot of some of the industries we support.

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Sales & Service

Contact us today to learn about our products and services, or find a representative in your area to answer your sales and support questions.

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Company

FormFactor is growing. Whether you are looking to invest in your lab, test floor, portfolio or career, we have more information for you here.

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Contact Us

Products Applications Industries Sales & Service Company

Overview Probe Systems Probes Probe Cards Quantum Cryogenics Overview Semiconductor R&D High Volume Manufacturing Partner Solutions Publications & Resources Overview Industries Overview Overview Contact Us Product Support Additional Programs Test/Measurement Services Company Information Careers Investors News, Events and Media Customer Collaboration

Modular Systems 150 mm Systems 200 mm Systems 300 mm Systems Dedicated Systems Autonomous Assistants High Volume Manufacturing Power Systems Vacuum/Pressure Systems Cryogenic Systems Integrated Systems With Keysight Additional Products Software Accessories Products/Programs View All Probe Systems Single/Dual Channel RF Single/Dual Broadband Coaxial Banded Waveguide Cryo/Vacuum/Hi-Temp Signal Integrity Specialty Mixed Signal RF and DC RF Multicontact DC Multicontact High Performance DC DC Parametric DC Power Optical Probes Pharos™ Probe Series Lightwave Probe (Single Fiber)VNA Calibration Tools Substrates Software Support Product Support View All Probe Products DRAM Flash Foundry & Logic Parametric Optical RF View All Probe Cards Probe Systems Wafer/Multi-chip Systems Chip-scale Systems Cryostats Dilution Refrigerators Additional Products Cryogenic Test Service View All Cryogenic Products DC Parametric Test Low Frequency Noise Power Semiconductors RF/mmW and 5G Terahertz mm-Wave Load-Pull Silicon Photonics VCSELs and MicroLEDs Quantum Computing Cryogenic Devices View All R&D Applications Foundry and Logic DRAM and Flash Memory Advanced Packaging RF/mmW and 5G AI Processors Optical Wafer Test Parametric Test Cryogenic Devices View All HVM Applications MeasureOne MeasureOne Program Overview 1/f Device Characterization Circuit Characterization Cryogenic / Magnetic Probing Power Semiconductor Probing RF Tuning & Load-Pull S-Parameter & DC Parametric Silicon Photonics Test Terahertz Probing Technical Papers Case Studies Test Insights Presentations Documentation and Downloads Computing, Data Centers, and Quantum 5G and 6G Communications Automotive Aerospace and Defense Global Locations Sales Representatives Contact Sales Parts & Service Request FormFactor RMA Cascade RMA Probe Systems Support Analytical Probe Support Analytical Probe Repair Pyramid Probe Card Support WinCal Support Documentation & Downloads Equipment Financing Educational Savings Logistics Service Cryogenic Test Company Profile Our History Leadership Board of Directors Corporate Citizenship Security & Compliance Working @ FormFactor United States Germany See All Job Openings Recruitment Privacy Policy Investor Relations Webinars Blog Podcasts Press Releases COMPASS Users Conference Lab to Fab Accelerating Profitability Sharing Expertise

MPS150 MPS150-SiPh Summit PM8/EPS200 See All...Autonomous DC Autonomous RF Autonomous SiPh Autonomous High-Power TRITON™Tesla IMS-K-mmW/THz IMS-K-Load-Pull IMS-K-LFN IMS-K-DC IMS-K-Power IMS-K-SiPh See All...Velox Velox Dash™WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Educational Savings Infinity Probe (145 GHz)InfinityXF Probe (250 GHz)InfinityXT Probe (110 GHz)|Z| Probe (67 GHz)|Z| Probe® Power T-Wave Probe (140 GHz-1.1 THz)ACP Probe (110 GHz)Infinity Waveguide (50-500 GHz)T-Wave Probe (140 GHz-1.1 THz)|Z| Probe - Coaxial (67 GHz)ACP Probe (110 GHz)Multi-|Z| Probe (20 GHz)FPC Probe (40-GHz)|Z| Probe® PCB (20 GHz)Resistive Matching and Termination InfinityQuad Probe (110) GHz)ACP-Q Probe (110 GHz)Unity Probe (20 GHz)Multi-|Z| Probe (20 GHz)QuadCard™ (Probe Dependent)DC-Q Probe InfinityQuad Eye-Pass Probe WPH Probe Multi-|Z| Probe DCP-X Probe DCP-HTR Series Probe DCP 100 Series Probe High Current Probe High Voltage Probe Ultra High-Power (UHP)Impedance Standard Substrates CSR Cal Substrates Multiline TRL Cal Substrates WinCal Velox Velox Dash™Probe Support Probe Repair Wincal Support PH Series SmartMatrix HFTAP Series TouchMatrix Altius Kepler™Apollo TrueScale Takumi Hikari Pyramid RF IQ3000 IQ2000 Base Flatiron™

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