Stay Connected
Receive product updates and event notifications
Subscribe to Our NewsletterExplore Our Products
FormFactor is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
Integrated Measurement Systems
FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.
-
IMS-K-mmW/THz
Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
-
IMS-K-Load-Pull
Integrated Measurement System with Keysight VNAs and Focus Microwaves tuners for On-Wafer Load-Pull Measurements
-
IMS-K-LFN
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
-
IMS-K-Cryo-LFN
Cryogenic Low Frequency Noise Prober
-
IMS-K-DC
Integrated system with Keysight SPA for DC parametric measurements
-
IMS-K-Power
Integrated system with Keysight PDA for power semiconductor device characterization
-
IMS-K-SiPh
Integrated system with Keysight Photonics Application Suite hardware and software
Wafer/Multi-chip Cryogenic Systems
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including IR-sensor test, radiometric test, DC and RF measurements at cryogenic temperatures. The systems can handle wafers up to 300 mm, and support cold filter, cold shutter and selectable f/value aperture as well as multiple optical instruments like IR radiation sources (black bodies). Up to eight probe positioners and/or a probe card can be integrated. Automatic chip alignment, OCR and wafer mark reading are exclusive features of our fully- and semi-automated systems. Cooling options include liquid helium (LHe), liquid nitrogen (LN2) or cryogen-free cooling. With a large install base of >80 stations worldwide, we bring expertise and technical know-how to provide the right solution for your measurement challenge.
Stay Connected
Receive product updates and event notifications
Subscribe to Our Newsletter