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Integrated Measurement Systems

FormFactor’s IMS products deliver robust, turn-key functionality, peace of mind, and a faster path to collecting high-quality on-wafer measurement data for today’s important and challenging test applications. Integrated Measurement Systems unite instruments and other products from FormFactor’s partners, including Keysight Technologies, along with FormFactor’s probe systems, probes, and everything else needed to deliver critical data for devices and integrated circuits on the wafer.

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  IMS-K-mmW/THz

  Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

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  IMS-K-Load-Pull

  Integrated Measurement System with Keysight VNAs and Focus Microwaves tuners for On-Wafer Load-Pull Measurements

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  IMS-K-LFN

  Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

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  IMS-K-Cryo-LFN

  Cryogenic Low Frequency Noise Prober

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  IMS-K-DC

  Integrated system with Keysight SPA for DC parametric measurements

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  IMS-K-Power

  Integrated system with Keysight PDA for power semiconductor device characterization

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  IMS-K-SiPh

  Integrated system with Keysight Photonics Application Suite hardware and software